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Good Practice Guide on the electrical characterization of graphene using non-contact and high-throughput methods
Authors:
Alexandra Fabricius,
Alessandro Cultrera,
Alessandro Catanzaro
Abstract:
The electrical characterisation of graphene, either in plane sheets or in properly geometrised form can be approached using non-contact methods already employed for thin film materials. The extraordinary thinness (and, correspondingly, the volume) of graphene, however, makes the proper application of these methods difficult. The electrical properties of interest (sheet electrical resistivity/condu…
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The electrical characterisation of graphene, either in plane sheets or in properly geometrised form can be approached using non-contact methods already employed for thin film materials. The extraordinary thinness (and, correspondingly, the volume) of graphene, however, makes the proper application of these methods difficult. The electrical properties of interest (sheet electrical resistivity/conductivity, concentration and mobility of charge carriers) must be indirectly derived from the measurement outcome by geometrical and electrical modelling; the assumptions behind such models (e.g., uniformity and isotropy, effective value of the applied fields, etc.) require careful consideration. The traceability of the measurement to the International System of units and a proper expression of measurement uncertainty is an issue.
This guide focuses on non-contact and high-throughput methods, that are methods where the graphene sample surface is not physically contacted with any metallic electrodes at any stage. A companion guide about contact methods is also available. The methods discussed are:
- Measurement of surface potential and work function using Scanning Kelvin Probe Microscopy (SKPM); - Measurement of sheet resistance by Microwave Resonant Cavity; - Measurement of sheet resistance by Terahertz time-domain spectroscopy (THz-TDS); For each method, a corresponding measurement protocol is discussed, which describes: - The measurement principle; - Sample requirements and preparation; - A description of the measurement equipment / apparatus; - Calibration standards and ways to achieve a traceable measurement;
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Submitted 28 July, 2020;
originally announced July 2020.
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Good Practice Guide on the electrical characterisation of graphene using contact methods
Authors:
Alexandra Fabricius,
Alessandro Catanzaro,
Alessandro Cultrera
Abstract:
This guide is a deliverable of the Joint Research Project 16NRM01 GRACE -- Develo** electrical characterisation methods for future graphene electronics. The project belongs to the European Metrology Programme for Innovation and Research (EMPIR). GRACE is framed within the Normative targeted program, and its overall goal is (1) the development of validated protocols for the measurement of the ele…
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This guide is a deliverable of the Joint Research Project 16NRM01 GRACE -- Develo** electrical characterisation methods for future graphene electronics. The project belongs to the European Metrology Programme for Innovation and Research (EMPIR). GRACE is framed within the Normative targeted program, and its overall goal is (1) the development of validated protocols for the measurement of the electrical properties of graphene, and their implementation in order to achieve accurate and fastthroughput measurement of graphene; and (2) the collaboration with international standardisation committees in order to initiate and develop dedicated documentary standards for the electrical characterisation of graphene. The adoption of this GPGs and, when published, the corresponding standards, will allow industry to perform accurate measurements of the electrical properties of graphene and thereby provide customers with reliable and comparable specifications of graphene as an industrial product.
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Submitted 27 July, 2020;
originally announced July 2020.
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A simple algorithm to find the L-curve corner in the regularisation of ill-posed inverse problems
Authors:
Alessandro Cultrera,
Luca Callegaro
Abstract:
We propose a simple algorithm to locate the "corner" of an L-curve, a function often used to select the regularisation parameter for the solution of ill-posed inverse problems. The algorithm involves the Menger curvature of a circumcircle and the golden section search method. It efficiently finds the regularisation parameter value corresponding to the maximum positive curvature region of the L-cur…
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We propose a simple algorithm to locate the "corner" of an L-curve, a function often used to select the regularisation parameter for the solution of ill-posed inverse problems. The algorithm involves the Menger curvature of a circumcircle and the golden section search method. It efficiently finds the regularisation parameter value corresponding to the maximum positive curvature region of the L-curve. The algorithm is applied to some commonly available test problems and compared to the typical way of locating the l-curve corner by means of its analytical curvature. The application of the algorithm to the data processing of an electrical resistance tomography experiment on thin conductive films is also reported.
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Submitted 24 September, 2020; v1 submitted 16 August, 2016;
originally announced August 2016.
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Electrical Resistance Tomography of Conductive Thin Films
Authors:
Alessandro Cultrera,
Luca Callegaro
Abstract:
The Electrical Resistance Tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution, and local conductivity values are obtained. Test samples are tin oxide films on glass substrates, with electrical contacts on the sample boundary, some samples are deliberately pattern…
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The Electrical Resistance Tomography (ERT) technique is applied to the measurement of sheet conductance maps of both uniform and patterned conductive thin films. Images of the sheet conductance spatial distribution, and local conductivity values are obtained. Test samples are tin oxide films on glass substrates, with electrical contacts on the sample boundary, some samples are deliberately patterned in order to induce null conductivity zones of known geometry while others contain higher conductivity inclusions. Four-terminal resistance measurements among the contacts are performed with a scanning setup. The ERT reconstruction is performed by a numerical algorithm based on the total variation regularization and the L-curve method. ERT correctly images the sheet conductance spatial distribution of the samples. The reconstructed conductance values are in good quantitative agreement with independent measurements performed with the van der Pauw and the four-point probe methods.
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Submitted 17 June, 2016;
originally announced June 2016.
