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HERMES: qualification of High pErformance pRogrammable Microprocessor and dEvelopment of Software ecosystem
Authors:
Nadia Ibellaatti,
Edouard Lepape,
Alp Kilic,
Kaya Akyel,
Kassem Chouayakh,
Fabrizio Ferrandi,
Claudio Barone,
Serena Curzel,
Michele Fiorito,
Giovanni Gozzi,
Miguel Masmano,
Ana Risquez Navarro,
Manuel Muñoz,
Vicente Nicolau Gallego,
Patricia Lopez Cueva,
Jean-noel Letrillard,
Franck Wartel
Abstract:
European efforts to boost competitiveness in the sector of space services promote the research and development of advanced software and hardware solutions. The EU-funded HERMES project contributes to the effort by qualifying radiation-hardened, high-performance programmable microprocessors, and by develo** a software ecosystem that facilitates the deployment of complex applications on such platf…
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European efforts to boost competitiveness in the sector of space services promote the research and development of advanced software and hardware solutions. The EU-funded HERMES project contributes to the effort by qualifying radiation-hardened, high-performance programmable microprocessors, and by develo** a software ecosystem that facilitates the deployment of complex applications on such platforms. The main objectives of the project include reaching a technology readiness level of 6 (i.e., validated and demonstrated in relevant environment) for the rad-hard NG-ULTRA FPGA with its ceramic hermetic package CGA 1752, developed within projects of the European Space Agency, French National Centre for Space Studies and the European Union. An equally important share of the project is dedicated to the development and validation of tools that support multicore software programming and FPGA acceleration, including Bambu for High-Level Synthesis and the XtratuM hypervisor with a level one boot loader for virtualization.
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Submitted 9 February, 2023;
originally announced February 2023.
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The Exit-Wave Power-Cepstrum Transform for Scanning Nanobeam Electron Diffraction: Robust Strain Map** at Subnanometer Resolution and Subpicometer Precision
Authors:
Elliot Padgett,
Megan E. Holtz,
Paul Cueva,
Yu-Tsun Shao,
Eric Langenberg,
Darrell G. Schlom,
David A. Muller
Abstract:
Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved map** of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques ar…
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Scanning nanobeam electron diffraction (NBED) with fast pixelated detectors is a valuable technique for rapid, spatially resolved map** of lattice structure over a wide range of length scales. However, intensity variations caused by dynamical diffraction and sample mistilts can hinder the measurement of diffracted disk centers as necessary for quantification. Robust data processing techniques are needed to provide accurate and precise measurements for complex samples and non-ideal conditions. Here we present an approach to address these challenges using a transform, called the exit wave power cepstrum (EWPC), inspired by cepstral analysis in audio signal processing. The EWPC transforms NBED patterns into real-space patterns with sharp peaks corresponding to inter-atomic spacings. We describe a simple analytical model for interpretation of these patterns that cleanly decouples lattice information from the intensity variations in NBED patterns caused by tilt and thickness. By tracking the inter-atomic spacing peaks in EWPC patterns, strain map** is demonstrated for two practical applications: map** of ferroelectric domains in epitaxially strained PbTiO3 films and map** of strain profiles in arbitrarily oriented core-shell Pt-Co nanoparticle fuel-cell catalysts. The EWPC transform enables lattice structure measurement at sub-pm precision and sub-nm resolution that is robust to small sample mistilts and random orientations.
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Submitted 13 October, 2020; v1 submitted 3 November, 2019;
originally announced November 2019.
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Strain Map** of Two-Dimensional Heterostructures with Sub-Picometer Precision
Authors:
Yimo Han,
Kayla Nguyen,
Michael Cao,
Paul Cueva,
Saien Xie,
Mark W. Tate,
Prafull Purohit,
Sol M. Gruner,
Jiwoong Park,
David A. Muller
Abstract:
Next-generation, atomically thin devices require in-plane, one-dimensional heterojunctions to electrically connect different two-dimensional (2D) materials. However, the lattice mismatch between most 2D materials leads to unavoidable strain, dislocations, or ripples, which can strongly affect their mechanical, optical, and electronic properties. We have developed an approach to map 2D heterojuncti…
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Next-generation, atomically thin devices require in-plane, one-dimensional heterojunctions to electrically connect different two-dimensional (2D) materials. However, the lattice mismatch between most 2D materials leads to unavoidable strain, dislocations, or ripples, which can strongly affect their mechanical, optical, and electronic properties. We have developed an approach to map 2D heterojunction lattice and strain profiles with sub-picometer precision and to identify dislocations and out-of-plane ripples. We collected diffraction patterns from a focused electron beam for each real-space scan position with a high-speed, high dynamic range, momentum-resolved detector - the electron microscope pixel array detector (EMPAD). The resulting four-dimensional (4D) phase space datasets contain the full spatially resolved lattice information of the sample. By using this technique on tungsten disulfide (WS2) and tungsten diselenide (WSe2) lateral heterostructures, we have mapped lattice distortions with 0.3 pm precision across multi-micron fields of view and simultaneously observed the dislocations and ripples responsible for strain relaxation in 2D laterally-epitaxial structures.
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Submitted 24 January, 2018;
originally announced January 2018.
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Data Processing For Atomic Resolution EELS
Authors:
Paul Cueva,
Robert Hovden,
Julia A. Mundy,
Huolin L. Xin,
David A. Muller
Abstract:
The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) map** with atomic resolution. These spectral maps are often dose-limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of…
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The high beam current and sub-angstrom resolution of aberration-corrected scanning transmission electron microscopes has enabled electron energy loss spectroscopic (EELS) map** with atomic resolution. These spectral maps are often dose-limited and spatially oversampled, leading to low counts/channel and are thus highly sensitive to errors in background estimation. However, by taking advantage of redundancy in the dataset map one can improve background estimation and increase chemical sensitivity. We consider two such approaches- linear combination of power laws and local background averaging-that reduce background error and improve signal extraction. Principal components analysis (PCA) can also be used to analyze spectrum images, but the poor peak-to-background ratio in EELS can lead to serious artifacts if raw EELS data is PCA filtered. We identify common artifacts and discuss alternative approaches. These algorithms are implemented within the Cornell Spectrum Imager, an open source software package for spectroscopic analysis.
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Submitted 13 December, 2011;
originally announced December 2011.
