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Plasmons in nanoscale metal junctions: optical rectification and thermometry
Authors:
Douglas Natelson,
Daniel R. Ward,
Falco Hüser,
Fabian Pauly,
Juan Carlos Cuevas,
David A. Corley,
James M. Tour
Abstract:
We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and photocurrents allows us to infer the optical frequency potential difference produced by the plasmon response of the junction. Together with the measured tunneling…
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We use simultaneous electronic transport and optical characterization measurements to reveal new information about electronic and optical processes in nanoscale junctions fabricated by electromigration. Comparing electronic tunneling and photocurrents allows us to infer the optical frequency potential difference produced by the plasmon response of the junction. Together with the measured tunneling conductance, we can then determine the locally enhanced electric field within the junction. In similar structures containing molecules, anti-Stokes and Stokes Raman emission allow us to infer the effective local vibrational and electronic temperatures as a function of DC current, examining heating and dissipation on the nanometer scale.
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Submitted 6 July, 2011;
originally announced July 2011.
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Vibrational and electronic heating in nanoscale junctions
Authors:
Daniel R. Ward,
David A. Corley,
James M. Tour,
Douglas Natelson
Abstract:
Understanding and controlling the flow of heat is a major challenge in nanoelectronics. When a junction is driven out of equilibrium by light or the flow of electric charge, the vibrational and electronic degrees of freedom are, in general, no longer described by a single temperature[1-6]. Moreover, characterizing the steady-state vibrational and electronic distributions {\it in situ} is extremely…
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Understanding and controlling the flow of heat is a major challenge in nanoelectronics. When a junction is driven out of equilibrium by light or the flow of electric charge, the vibrational and electronic degrees of freedom are, in general, no longer described by a single temperature[1-6]. Moreover, characterizing the steady-state vibrational and electronic distributions {\it in situ} is extremely challenging. Here we show that surface-enhanced Raman emission may be used to determine the effective temperatures for both the vibrational modes and the flowing electrons in a biased metallic nanoscale junction decorated with molecules[7]. Molecular vibrations show mode-specific pum** by both optical excitation[8] and dc current[9], with effective temperatures exceeding several hundred Kelvin. AntiStokes electronic Raman emission\cite[10,11] indicates electronic effective temperature also increases to as much as three times its no-current values at bias voltages of a few hundred mV. While the precise effective temperatures are model-dependent, the trends as a function of bias conditions are robust, and allow direct comparisons with theories of nanoscale heating.
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Submitted 27 June, 2011;
originally announced June 2011.
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Contact effects in polymer field-effect transistors
Authors:
D. Natelson,
B. H. Hamadani,
J. W. Ciszek,
D. A. Corley,
J. M. Tour
Abstract:
Contact resistances often contribute significantly to the overall device resistance in organic field-effect transistors (OFETs). Understanding charge injection at the metal-organic interface is critical to optimizing OFET device performance. We have performed a series of experiments using bottom-contact poly(3-hexylthiophene) (P3HT) OFETs in the shallow channel limit to examine the injection pro…
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Contact resistances often contribute significantly to the overall device resistance in organic field-effect transistors (OFETs). Understanding charge injection at the metal-organic interface is critical to optimizing OFET device performance. We have performed a series of experiments using bottom-contact poly(3-hexylthiophene) (P3HT) OFETs in the shallow channel limit to examine the injection process. When contacts are ohmic we find that contact resistivity is inversely proportional to carrier mobility, consistent with diffusion-limited injection. However, data from devices with other electrode materials indicate that this simple picture is inadequate to describe contacts with significant barriers. A generalized transmission line method allows the analysis of nonohmic contacts, and we find reasonable agreement with a model for injection that accounts for the hop** nature of conduction in the polymer. Variation of the (unintentional) dopant concentration in the P3HT can significantly alter the injection process via changes in metal-organic band alignment. At very low do** levels, transport suggests the formation of a barrier at the Au/P3HT interface, while Pt/P3HT contacts remain ohmic with comparatively low resistance. We recently observed that self-assembled monolayers on the metal source/drain electrodes can significantly decrease contact resistance and maintain ohmic conduction under conditions that would result in nonohmic, high resistance contacts to untreated electrodes. Finally, we discuss measurements on extremely short channel devices, in the initial steps toward examining transport through individual polymer chains.
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Submitted 27 July, 2006;
originally announced July 2006.
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Controlling charge injection in organic field-effect transistors using self-assembled monolayers
Authors:
B. H. Hamadani,
D. A. Corley,
J. W. Ciszek,
J. M. Tour,
D. Natelson
Abstract:
We have studied charge injection across the metal/organic semiconductor interface in bottom-contact poly(3-hexylthiophene) (P3HT) field-effect transistors, with Au source and drain electrodes modified by self-assembled monolayers (SAMs) prior to active polymer deposition. By using the SAM to engineer the effective Au work function, we markedly affect the charge injection process. We systematical…
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We have studied charge injection across the metal/organic semiconductor interface in bottom-contact poly(3-hexylthiophene) (P3HT) field-effect transistors, with Au source and drain electrodes modified by self-assembled monolayers (SAMs) prior to active polymer deposition. By using the SAM to engineer the effective Au work function, we markedly affect the charge injection process. We systematically examine the contact resistivity and intrinsic channel mobility, and show that chemically increasing the injecting electrode work function significantly improves hole injection relative to untreated Au electrodes.
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Submitted 24 May, 2006;
originally announced May 2006.
