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A multi-stop time-of-flight spectrometer for the measurement of positron annihilation-induced electrons in coincidence with the Doppler-shifted annihilation gamma photon
Authors:
V. A. Chirayath,
R. W. Gladen,
A. D. McDonald,
A. J. Fairchild,
P. V. Joglekar,
S. Satyal,
Z. H. Lim,
T. N. Shead,
M. D. Chrysler,
S. Mukherjee,
B. M. Barnett,
N. K. Byrnes,
A. R. Koymen,
R. G. Greaves,
A. H. Weiss
Abstract:
Here we describe an advanced multi functional, variable-energy positron beam system capable of measuring the energies of multiple positron-induced electrons in coincidence with the Doppler-shifted gamma photon resulting from the annihilation of the correlated positron. The measurements were carried out using the unique characteristics of the digital time-of-flight spectrometer and the gamma spectr…
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Here we describe an advanced multi functional, variable-energy positron beam system capable of measuring the energies of multiple positron-induced electrons in coincidence with the Doppler-shifted gamma photon resulting from the annihilation of the correlated positron. The measurements were carried out using the unique characteristics of the digital time-of-flight spectrometer and the gamma spectrometer available with the advanced positron beam system. These measurements have resulted in (i) the first digital time of flight spectrum of positron annihilation-induced Auger electrons generated using coincident signals from a high-purity Ge detector and a micro-channel plate; (ii) a two-dimensional array of the energy of Doppler-broadened annihilation gamma and the time of flight of positron-annihilation induced Auger electrons or secondary electrons measured in coincidence with the annihilation gamma photon; and (iii) the time of flight spectra of multiple secondary electrons ejected from a bilayer graphene surface as a result of the impact and(or) annihilation of positrons. The novelty of the gamma electron coincidence spectroscopy has been demonstrated by extracting the Doppler-broadened spectrum of gamma photons emitted due to the annihilation of positrons exclusively with 1s electrons of carbon. The width of the extracted Doppler-broadened gamma spectrum has been found to be consistent with the expected broadening of the annihilation gamma spectrum due to the momentum of the 1s electrons in carbon.
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Submitted 27 January, 2020;
originally announced January 2020.
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Application of Doppler Broadened Gamma Spectroscopy to Study the Surface of Graphene
Authors:
A. H. Weiss,
V. A. Chirayath,
R. W. Gladen,
A. J. Fairchild,
M. D. Chrysler,
P. A. Sterne,
A. R. Koymen
Abstract:
We present Doppler broadened gamma spectra, obtained using the newly developed advanced positron beam at the University of Texas at Arlington, from a sample consisting of 6 to 8 layers of graphene (MLG) on polycrystalline Cu. The kinetic energy of the positron beam was varied form 2 eV to 20 keV allowing for a depth resolved measurement. The ratio curves formed by dividing the measured Doppler bro…
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We present Doppler broadened gamma spectra, obtained using the newly developed advanced positron beam at the University of Texas at Arlington, from a sample consisting of 6 to 8 layers of graphene (MLG) on polycrystalline Cu. The kinetic energy of the positron beam was varied form 2 eV to 20 keV allowing for a depth resolved measurement. The ratio curves formed by dividing the measured Doppler broadened gamma spectra obtained at low positron kinetic energies (~2eV) to the gamma spectra obtained at 20 keV were compared to ratio curves found by dividing the calculated spectra of bulk graphite to bulk Cu. The ratio curves obtained from the measured results show qualitative agreement with those obtained from the calculated spectra. In particular, both sets of curves indicate a much reduced intensity at high momentum. The agreement between the measured and calculated curves is consistent with the hypothesis that the 2eV spectra correspond to the Doppler broadened spectra from the thin overlayer of Graphene (which we anticipate should be similar to the spectra obtained from bulk graphite) and that the spectra taken at 20 keV corresponds to bulk Cu due to the fact that most of the positrons implanted at this energy annihilate in the Cu substrate. The results taken at 2 eV provide evidence that it is possible to obtain chemically sensitive information from the top atomic layers of surfaces (both internal and external) from an analysis of the high momentum tail of the Doppler broadened gamma spectra obtained from the annihilation of positrons at the surface.
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Submitted 24 July, 2019;
originally announced July 2019.
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Positronium formation in graphene and graphite
Authors:
V. A. Chirayath,
A. J. Fairchild,
R. W. Gladen,
M. D. Chrysler,
A. R. Koymen,
A. H. Weiss
Abstract:
Positronium (Ps) formation on the surface of clean polycrystalline copper (Cu), highly oriented pyrolytic graphite (HOPG) and multi layer graphene (MLG) grown on a polycrystalline copper substrate has been investigated as a function of incident positron kinetic energy (1.5eV to 1keV). Measurments on Cu indicate that as the kinetic energy of the incident positrons increases from 1.5eV to 900eV, the…
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Positronium (Ps) formation on the surface of clean polycrystalline copper (Cu), highly oriented pyrolytic graphite (HOPG) and multi layer graphene (MLG) grown on a polycrystalline copper substrate has been investigated as a function of incident positron kinetic energy (1.5eV to 1keV). Measurments on Cu indicate that as the kinetic energy of the incident positrons increases from 1.5eV to 900eV, the fraction of positrons that form Ps ($f_{Ps}$) decreases from ~0.5 to ~0.3. However, in HOPG and MLG, instead of a monotonic decrease of $f_{Ps}$ with positron kinetic energy, a sharp peak is observed at ~ 5eV and above ~200eV,remains nearly constant in HOPG and MLG. We propose that in HOPG and MLG, at low incident positron energies the Ps formation is dominated either by a surface Plasmon assisted electron pick up process or by an energy dependent back scattering process. Both these processes can explain the peak observed and the present data can help to augment the understanding of Ps formation from layered materials.
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Submitted 24 July, 2019;
originally announced July 2019.
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Direct observation of electron emission as a result of a VVV Auger transition in the valence band of Graphene
Authors:
V. A. Chirayath,
V. Callewaert,
M. D. Chrysler,
A. J. Fairchild,
R. W. Gladen,
A. D. Mcdonald,
S. K. Imam,
K. Shastry,
A. R. Koymen,
R. Saniz,
B. Barbiellini,
K. Rajeshwar,
B. Partoens,
A. H. Weiss
Abstract:
We report the first direct observation of electron emission into the vacuum as a result of a VVV Auger transition resulting from the relaxation of a deep hole in the valence band. A beam of low energy (<1.25eV) positrons was used to deposit positrons onto the surface of samples consisting of single layer graphene, multi-layer graphene and graphite. The distribution of electrons emitted from the sa…
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We report the first direct observation of electron emission into the vacuum as a result of a VVV Auger transition resulting from the relaxation of a deep hole in the valence band. A beam of low energy (<1.25eV) positrons was used to deposit positrons onto the surface of samples consisting of single layer graphene, multi-layer graphene and graphite. The distribution of electrons emitted from the samples as a result of the annihilation of the positron showed peak extending up to ~12 eV with a maximum at ~4eV. The observed peak was ~17 times larger than the previously observed annihilation induced C KVV peak. An analysis based upon a density functional theory calculation of the positron annihilation rates indicates that the width and intensity of the peak is consistent with electron emission resulting from VVV Auger transition excited by the annihilation of valence band electrons. Good agreement was found between the data from the single layer graphene on Cu surface with a theoretical line shape found from a self-folding of the density of states for a free standing graphene layer. The agreement between the theoretical and measured intensities for the KVV and VVV transitions indicates that the branching ratio for holes to decay via an Auger transition is nearly the same in both cases (i.e. close to 100%). Our results suggest the possibility of using annihilation induced VVV Auger spectroscopy to study the properties of the local density of states and the hole decay processes in materials in which the valence band width exceeds the work function.
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Submitted 4 November, 2016; v1 submitted 29 October, 2016;
originally announced October 2016.