Showing 1–1 of 1 results for author: Cherry, O

Electric field sensing near the surface microstructure of an atom chip using cold Rydberg atoms

Authors: J. D. Carter, O. Cherry, J. D. D. Martin

Abstract: The electric fields near the heterogeneous metal/dielectric surface of an atom chip were measured using cold atoms. The atomic sensitivity to electric fields was enhanced by exciting the atoms to Rydberg states that are 10^8 times more polarizable than the ground state. We attribute the measured fields to charging of the insulators between the atom chip wires. Surprisingly, it is observed that the… ▽ More The electric fields near the heterogeneous metal/dielectric surface of an atom chip were measured using cold atoms. The atomic sensitivity to electric fields was enhanced by exciting the atoms to Rydberg states that are 10^8 times more polarizable than the ground state. We attribute the measured fields to charging of the insulators between the atom chip wires. Surprisingly, it is observed that these fields may be dramatically lowered with appropriate voltage biasing, suggesting configurations for the future development of hybrid quantum systems. △ Less

Submitted 29 June, 2012; originally announced June 2012.

Comments: 7 pages, 5 figures

Journal ref: Phys. Rev. A 86, 053401 (2012)