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Showing 1–3 of 3 results for author: Cabral, M J

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  1. arXiv:2310.12493  [pdf

    cond-mat.mtrl-sci physics.app-ph

    Atomic-scale investigation of $γ$-Ga$_2$O$_3$ deposited on MgAl$_2$O$_4$ and its relationship with $β$-Ga$_2$O$_3$

    Authors: J. Tang, K. Jiang, C. Xu, M. J. Cabral, K. Xiao, L. M. Porter, R. F. Davis

    Abstract: Nominally phase-pure $γ$-$Ga_2O_3$ was deposited on (100) $MgAl_2O_4$ within a narrow temperature window centered at $\sim$470 $^{\circ}$C using metal-organic chemical vapor deposition (MOCVD). The film deposited at 440 $^{\circ}$C exhibited either poor crystallization or an amorphous structure; the film grown at 500 $^{\circ}$C contained both $β$-$Ga_2O_3$ and $γ$-$Ga_2O_3$. A nominally phase-pur… ▽ More

    Submitted 20 October, 2023; v1 submitted 19 October, 2023; originally announced October 2023.

    Comments: The following article has been submitted to APL Materials

  2. arXiv:1911.05853  [pdf, other

    cond-mat.mtrl-sci

    Decoding the complexities of lead-based relaxor ferroelectrics

    Authors: Abinash Kumar, Jonathon N. Baker, Preston C. Bowes, Matthew J. Cabral, Shujun Zhang, Elizabeth Dickey, Douglas L. Irving, James M. LeBeau

    Abstract: Relaxor ferroelectrics, which can exhibit exceptional electromechanical coupling are some of the most important functional materials with applications ranging from ultrasound imaging to actuators and sensors in microelectromechanical devices. Since their discovery nearly 60 years ago, the complexity of nanoscale chemical and structural heterogeneity in these systems has made understanding the orig… ▽ More

    Submitted 13 November, 2019; originally announced November 2019.

  3. arXiv:1910.14195  [pdf, other

    stat.AP stat.ME

    Accounting for Location Measurement Error in Imaging Data with Application to Atomic Resolution Images of Crystalline Materials

    Authors: Matthew J. Miller, Matthew J. Cabral, Elizabeth C. Dickey, James M. LeBeau, Brian J. Reich

    Abstract: Scientists use imaging to identify objects of interest and infer properties of these objects. The locations of these objects are often measured with error, which when ignored leads to biased parameter estimates and inflated variance. Current measurement error methods require an estimate or knowledge of the measurement error variance to correct these estimates, which may not be available. Instead,… ▽ More

    Submitted 13 May, 2020; v1 submitted 30 October, 2019; originally announced October 2019.

    Comments: 29 pages including appendices, 4 figures, 13 page supplement