Skip to main content

Showing 1–4 of 4 results for author: Byrne, D O

.
  1. arXiv:2407.08769  [pdf, other

    cond-mat.mes-hall

    AuNR-SMA: Automated Gold Nanorod Spectral Morphology Analysis Pipeline

    Authors: Samuel P. Gleason, Jakob C. Dahl, Mahmoud Elzouka, Xingzhi Wang, Dana O. Byrne, Mumtaz Gababa, Hannah Cho, Ravi Prasher, Sean Lubner, Emory Chan, A. Paul Alivisatos

    Abstract: The development of a colloidal synthesis procedure to produce nanomaterials of a specific size with high shape and size purity is often a time consuming, iterative process. This is often due to the time, resource and expertise intensive characterization methods required for quantitative determination of nanomaterial size and shape. Absorption spectroscopy is often the easiest method of colloidal n… ▽ More

    Submitted 11 July, 2024; originally announced July 2024.

  2. arXiv:2406.01141  [pdf, other

    physics.optics cond-mat.mtrl-sci physics.comp-ph

    Improved Three-Dimensional Reconstructions in Electron Ptychography through Defocus Series Measurements

    Authors: Marcel Schloz, Thomas C. Pekin, Hamish G. Brown, Dana O. Byrne, Bryan D. Esser, Emmanuel Terzoudis-Lumsden, Takashi Taniguchi, Kenji Watanabe, Scott D. Findlay, Benedikt Haas, Jim Ciston, Christoph T. Koch

    Abstract: A detailed analysis of ptychography for 3D phase reconstructions of thick specimens is performed. We introduce multi-focus ptychography, which incorporates a 4D-STEM defocus series to enhance the quality of 3D reconstructions along the beam direction through a higher overdetermination ratio. This method is compared with established multi-slice ptychography techniques, such as conventional ptychogr… ▽ More

    Submitted 3 June, 2024; originally announced June 2024.

  3. arXiv:2312.02621  [pdf, other

    cond-mat.mtrl-sci

    Probing defectivity beneath the hydrocarbon blanket in 2D hBN using TEM-EELS

    Authors: Dana O. Byrne, Jim Ciston, Frances I. Allen

    Abstract: The controlled creation and manipulation of defects in 2D materials has become increasingly popular as a means to design and tune new material functionalities. However, defect characterization by direct atomic imaging is often severely limited by surface contamination due to a blanket of hydrocarbons. Thus, analysis techniques are needed that can characterize atomic scale defects despite the conta… ▽ More

    Submitted 5 December, 2023; originally announced December 2023.

  4. arXiv:2309.05250  [pdf, other

    cond-mat.mtrl-sci

    Iterative Phase Retrieval Algorithms for Scanning Transmission Electron Microscopy

    Authors: Georgios Varnavides, Stephanie M. Ribet, Steven E. Zeltmann, Yue Yu, Benjamin H. Savitzky, Dana O. Byrne, Frances I. Allen, Vinayak P. Dravid, Mary C. Scott, Colin Ophus

    Abstract: Scanning transmission electron microscopy (STEM) has been extensively used for imaging complex materials down to atomic resolution. The most commonly employed STEM modality, annular dark-field imaging, produces easily-interpretable contrast, but is dose-inefficient and produces little to no discernible contrast for light elements and weakly-scattering samples. An alternative is to use STEM phase r… ▽ More

    Submitted 20 May, 2024; v1 submitted 11 September, 2023; originally announced September 2023.

    Comments: 25 pages, 14 figures, 1 table