Imaging Temperature and Thickness of Thin Planar Liquid Water Jets in Vacuum
Authors:
Tillmann Buttersack,
Henrik Haak,
Hendrik Bluhm,
Uwe Hergenhahn,
Gerard Meijer,
Bernd Winter
Abstract:
We present spatially resolved measurements of the temperature of a flat liquid water microjet for varying pressures, from vacuum to 100% relative humidity. The entire jet surface is probed in a single shot by a high-resolution infrared camera. Obtained 2D images are substantially influenced by the temperature of the apparatus on the opposite side of the IR camera; a protocol to correct for the the…
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We present spatially resolved measurements of the temperature of a flat liquid water microjet for varying pressures, from vacuum to 100% relative humidity. The entire jet surface is probed in a single shot by a high-resolution infrared camera. Obtained 2D images are substantially influenced by the temperature of the apparatus on the opposite side of the IR camera; a protocol to correct for the thermal background radiation is presented. In vacuum, we observe cooling rates due to water evaporation on the order of 105 K/s. For our system, this corresponds to a temperature decrease of approximately 15 K between upstream and downstream positions of the flowing leaf. Making reasonable assumptions on the absorption of the thermal background radiation in the flatjet we can extend our analysis to infer a thickness map. For a reference system our value for the thickness is in good agreement with the one reported from white light interferometry.
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Submitted 6 April, 2023;
originally announced April 2023.
Ångstrom depth resolution with chemical specificity at the liquid-vapor interface
Authors:
R. Dupuy,
J. Filser,
C. Richter,
T. Buttersack,
F. Trinter,
S. Gholami,
R. Seidel,
C. Nicolas,
J. Bozek,
D. Egger,
H. Oberhofer,
S. Thürmer,
U. Hergenhahn,
K. Reuter,
B. Winter,
H. Bluhm
Abstract:
The determination of depth profiles across interfaces is of primary importance in many scientific and technological areas. Photoemission spectroscopy is in principle well suited for this purpose, yet a quantitative implementation for investigations of liquid-vapor interfaces is hindered by the lack of understanding of electron-scattering processes in liquids. Previous studies have shown, however,…
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The determination of depth profiles across interfaces is of primary importance in many scientific and technological areas. Photoemission spectroscopy is in principle well suited for this purpose, yet a quantitative implementation for investigations of liquid-vapor interfaces is hindered by the lack of understanding of electron-scattering processes in liquids. Previous studies have shown, however, that core-level photoelectron angular distributions (PADs) are altered by depth-dependent elastic electron scattering and can, thus, reveal information on the depth distribution of species across the interface. Here, we explore this concept further and show that the anisotropy parameter characterizing the PAD scales linearly with the average distance of atoms along the surface normal. This behavior can be accounted for in the low-collision-number regime. We also show that results for different atomic species can be compared on the same length scale. We demonstrate that atoms separated by about 1~Å~along the surface normal can be clearly distinguished with this method, achieving excellent depth resolution.
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Submitted 14 February, 2023; v1 submitted 30 September, 2022;
originally announced September 2022.
