Optical Mass Spectrometry of Cold $\mathrm{RaOH}^+$ and ${\mathrm{RaOCH}_3}^+$
Authors:
M. Fan,
C. A. Holliman,
X. Shi,
H. Zhang,
M. W. Straus,
X. Li,
S. W. Buechele,
A. M. Jayich
Abstract:
We present an all-optical mass spectrometry technique to identify trapped ions. The new method uses laser-cooled ions to determine the mass of a cotrapped dark ion with a sub-dalton resolution within a few seconds. We apply the method to identify the first controlled synthesis of cold, trapped $\mathrm{RaOH}^+$ and ${\mathrm{RaOCH}_3}^+$. These molecules are promising for their sensitivity to time…
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We present an all-optical mass spectrometry technique to identify trapped ions. The new method uses laser-cooled ions to determine the mass of a cotrapped dark ion with a sub-dalton resolution within a few seconds. We apply the method to identify the first controlled synthesis of cold, trapped $\mathrm{RaOH}^+$ and ${\mathrm{RaOCH}_3}^+$. These molecules are promising for their sensitivity to time and parity violations that could constrain sources of new physics beyond the standard model. The nondestructive nature of the mass spectrometry technique may help identify molecular ions or highly charged ions prior to optical spectroscopy. Unlike previous mass spectrometry techniques for small ion crystals that rely on scanning, the method uses a Fourier transform which is inherently broadband and comparatively fast. The technique's speed provides new opportunities for studying state-resolved chemical reactions in ion traps.
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Submitted 11 January, 2021; v1 submitted 22 July, 2020;
originally announced July 2020.
A Transition-edge Sensor-based X-ray Spectrometer for the Study of Highly Charged Ions at the National Institute of Standards and Technology Electron Beam Ion Trap
Authors:
P. Szypryt,
G. C. O'Neil,
E. Takacs,
J. N. Tan,
S. W. Buechele,
A. S. Naing,
D. A. Bennett,
W. B. Doriese,
M. Durkin,
J. W. Fowler,
J. D. Gard,
G. C. Hilton,
K. M. Morgan,
C. D. Reintsema,
D. R. Schmidt,
D. S. Swetz,
J. N. Ullom,
Yu. Ralchenko
Abstract:
We report on the design, commissioning, and initial measurements of a Transition-edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysi…
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We report on the design, commissioning, and initial measurements of a Transition-edge Sensor (TES) x-ray spectrometer for the Electron Beam Ion Trap (EBIT) at the National Institute of Standards and Technology (NIST). Over the past few decades, the NIST EBIT has produced numerous studies of highly charged ions in diverse fields such as atomic physics, plasma spectroscopy, and laboratory astrophysics. The newly commissioned NIST EBIT TES Spectrometer (NETS) improves the measurement capabilities of the EBIT through a combination of high x-ray collection efficiency and resolving power. NETS utilizes 192 individual TES x-ray microcalorimeters (166/192 yield) to improve upon the collection area by a factor of ~30 over the 4-pixel neutron transmutation doped germanium-based microcalorimeter spectrometer previously used at the NIST EBIT. The NETS microcalorimeters are optimized for the x-ray energies from roughly 500 eV to 8,000 eV and achieve an energy resolution of 3.7 eV to 5.0 eV over this range, a more modest (<2X) improvement over the previous microcalorimeters. Beyond this energy range NETS can operate with various trade-offs, the most significant of which are reduced efficiency at lower energies and being limited to a subset of the pixels at higher energies. As an initial demonstration of the capabilities of NETS, we measured transitions in He-like and H-like O, Ne, and Ar as well as Ni-like W. We detail the energy calibration and data analysis techniques used to transform detector counts into x-ray spectra, a process that will be the basis for analyzing future data.
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Submitted 11 May, 2020;
originally announced May 2020.
On low-energy tail distortions in the detector responsefunction of x-ray microcalorimeter spectrometers
Authors:
G. C. O'Neil,
P. Szypryt,
E. Takacs,
J. N. Tan,
S. W. Buechele,
A. S. Naing,
Y. I. Joe,
D. Swetz,
D. R. Schmidt,
W. B. Doriese,
J. D. Gard,
C. D. Reintsema,
J. N. Ullom,
J. S. Villarrubia,
Yu. Ralchenko
Abstract:
We use narrow spectral lines from the x-ray spectra of various highlycharged ions to measure low-energy tail-like deviations from a Gaussian responsefunction in a microcalorimter x-ray spectrometer with Au absorbers at energiesfrom 650 eV to 3320 eV. We review the literature on low energy tails in othermicrocalorimter x-ray spectrometers and present a model that explains all thereviewed tail fract…
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We use narrow spectral lines from the x-ray spectra of various highlycharged ions to measure low-energy tail-like deviations from a Gaussian responsefunction in a microcalorimter x-ray spectrometer with Au absorbers at energiesfrom 650 eV to 3320 eV. We review the literature on low energy tails in othermicrocalorimter x-ray spectrometers and present a model that explains all thereviewed tail fraction measurements. In this model a low energy tail arises fromthe combination of electron escape and energy trap** associated with Bi x-rayabsorbers.
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Submitted 11 May, 2020;
originally announced May 2020.
