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X-ray reflectivity with a twist: quantitative time-resolved X-ray reflectivity using monochromatic synchrotron radiation
Authors:
Howie Joress,
Shane Quinlan Arlington,
Timothy P. Weihs,
Joel D. Brock,
Arthur Woll
Abstract:
We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect the specular reflections. By rotating the sample normal out of the plane of the incident fan, we can separate the surface diffuse scatter from the reflectivity s…
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We have developed an improved method of time-resolved x-ray reflectivity (XRR) using monochromatic synchrotron radiation. Our method utilizes a polycapillary x-ray optic to create a range of incident angles and an area detector to collect the specular reflections. By rotating the sample normal out of the plane of the incident fan, we can separate the surface diffuse scatter from the reflectivity signal, greatly improving the quality of the XRR spectra compared to previous implementations. We demonstrate the time-resolved capabilities of this system, with temporal resolution as low as 10 ms, by measuring XRR during the annealing of Al/Ni nano-scale multilayers and use this information to extract the activation energy for interdiffusion in this system.
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Submitted 10 December, 2018;
originally announced December 2018.
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Quick X-ray Reflectivity using Monochromatic Synchrotron Radiation for Time-Resolved Applications
Authors:
H. Joress,
J. D. Brock,
A. R. Woll
Abstract:
We describe and demonstrate a new technique for parallel collection of x-ray reflectivity data, compatible with monochromatic synchrotron radiation and flat substrates, and apply it to the in-situ observation of thin-film growth. The method employs a polycapillary x-ray optic to produce a converging fan of radiation incident onto a sample surface, and an area detector to simultaneously collect the…
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We describe and demonstrate a new technique for parallel collection of x-ray reflectivity data, compatible with monochromatic synchrotron radiation and flat substrates, and apply it to the in-situ observation of thin-film growth. The method employs a polycapillary x-ray optic to produce a converging fan of radiation incident onto a sample surface, and an area detector to simultaneously collect the XRR signal over an angular range matching that of the incident fan. Factors determining the range and instrumental resolution of the technique in reciprocal space, in addition to the signal-to-background ratio, are described in detail. Our particular implementation records $\sim$5\degree{} in $2θ$ and resolves Kiessig fringes from samples with layer thicknesses ranging from 3 to 76 nm. Finally, we illustrate the value of this approach by showing in-situ XRR data obtained with 100 ms time resolution during the growth of epitaxial \ce{La_{0.7}Sr_{0.3}MnO3} on \ce{SrTiO3} by Pulsed Laser Deposition (PLD) at the Cornell High Energy Synchrotron Source (CHESS). Compared to prior methods for parallel XRR data collection, ours is the first method that is both sample-independent and compatible with highly collimated, monochromatic radiation typical of 3rd generation synchrotron sources. Further, our technique can be readily adapted for use with laboratory-based sources.
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Submitted 1 March, 2018; v1 submitted 8 November, 2017;
originally announced November 2017.
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Structure of the photo-catalytically active surface of SrTiO3
Authors:
Manuel Plaza,
Xin Huang,
J. Y. Peter Ko,
Joel D. Brock,
Mei Shen,
Burton H. Simpson,
Joaquín Rodríguez-López,
Nicole L. Ritzert,
Héctor D. Abruña,
Kendra Letchworth-Weaver,
Deniz Gunceler,
T. A. Arias,
Darrell G. Schlom
Abstract:
A major goal of energy research is to use visible light to cleave water directly, without an applied voltage, into hydrogen and oxygen. Since the initial reports of the ultraviolet (UV) activity of TiO2 and SrTiO3 in the 1970s, researchers have pursued a fundamental understanding of the mechanistic and molecular-level phenomena involved in photo-catalysis. Although it requires UV light, after four…
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A major goal of energy research is to use visible light to cleave water directly, without an applied voltage, into hydrogen and oxygen. Since the initial reports of the ultraviolet (UV) activity of TiO2 and SrTiO3 in the 1970s, researchers have pursued a fundamental understanding of the mechanistic and molecular-level phenomena involved in photo-catalysis. Although it requires UV light, after four decades SrTiO3 is still the gold standard for splitting water. It is chemically stable and catalyzes both the hydrogen and the oxygen reactions without applied bias. While ultrahigh vacuum (UHV) surface science techniques have provided useful insights, we still know relatively little about the structure of electrodes in contact with electrolytes under operating conditions. Here, we report the surface structure evolution of a SrTiO3 electrode during water splitting, before and after training with a positive bias. Operando high-energy X-ray reflectivity measurements demonstrate that training the electrode irreversibly reorders the surface. Scanning electrochemical microscopy (SECM) at open circuit correlates this training with a tripling of the activity toward photo-induced water splitting. A novel first-principles joint density-functional theory (JDFT) simulation constrained to the X-ray data via a generalized penalty function identifies an anatase-like structure for the more active, trained surface.
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Submitted 5 August, 2015;
originally announced August 2015.
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Influence of Ti do** on the incommensurate charge density wave in 1T-TaS2
Authors:
X. M. Chen,
A. J. Miller,
C. Nugroho,
G. A. de la Pena,
Y. I. Joe,
A. Kogar,
J. D. Brock,
J. Geck,
G. J. MacDougall,
S. L. Cooper,
E. Fradkin,
D. J. Van Harlingen,
P. Abbamonte
Abstract:
We report temperature-dependent transport and x-ray diffraction measurements of the influence of Ti hole do** on the charge density wave (CDW) in 1T-Ta(1-x)Ti(x)S(2). Confirming past studies, we find that even trace impurities eliminate the low-temperature commensurate (C) phase in this system. Surprisingly, the magnitude of the in-plane component of the CDW wave vector in the nearly commensurat…
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We report temperature-dependent transport and x-ray diffraction measurements of the influence of Ti hole do** on the charge density wave (CDW) in 1T-Ta(1-x)Ti(x)S(2). Confirming past studies, we find that even trace impurities eliminate the low-temperature commensurate (C) phase in this system. Surprisingly, the magnitude of the in-plane component of the CDW wave vector in the nearly commensurate (NC) phase does not change significantly with Ti concentration, as might be expected from a changing Fermi surface volume. Instead, the angle of the CDW in the basal plane rotates, from 11.9 deg at x=0 to 16.4 deg at x=0.12. Ti substitution also leads to an extended region of coexistence between incommensurate (IC) and NC phases, indicating heterogeneous nucleation near the transition. Finally, we explain a resistive anomaly originally observed by DiSalvo [F. J. DiSalvo, et al., Phys. Rev. B {\bf 12}, 2220 (1975)] as arising from pinning of the CDW on the crystal lattice. Our study highlights the importance of commensuration effects in the NC phase, particularly at x ~ 0.08.
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Submitted 20 May, 2015; v1 submitted 24 November, 2014;
originally announced November 2014.
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Epitaxial growth of Bi$_2$Pt$_2$O$_7$ pyrochlore
Authors:
Araceli Gutierrez-Llorente,
Howie Joress,
Arthur Woll,
Megan E. Holtz,
Matthew J. Ward,
Matthew C. Sullivan,
David A. Muller,
Joel D. Brock
Abstract:
Certain pyrochlore oxides are among the best oxygen catalysts in alkaline media. Hence, exploring epitaxial films of these materials is of great fundamental and technological interest. Unfortunately, direct film growth of one of the most promising pyrochlores, Bi$_2$Pt$_2$O$_7$, has not yet been achieved, owing to the difficulty of oxidizing platinum metal in the precursor material to Pt$^{4+}$. I…
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Certain pyrochlore oxides are among the best oxygen catalysts in alkaline media. Hence, exploring epitaxial films of these materials is of great fundamental and technological interest. Unfortunately, direct film growth of one of the most promising pyrochlores, Bi$_2$Pt$_2$O$_7$, has not yet been achieved, owing to the difficulty of oxidizing platinum metal in the precursor material to Pt$^{4+}$. In this work, in order to induce oxidation of the platinum, we annealed pulsed laser deposited films consisting of epitaxial $δ$-Bi$_2$O$_3$ and co-deposited, comparatively disordered platinum. We present synchrotron x-ray diffraction results that show the annealed films are the first epitaxial crystals of Bi$_2$Pt$_2$O$_7$. We also visualized the pyrochlore structure by scanning transmission electron microscopy, and observed ordered cation vacancies in a bismuth-rich film but not in a platinum-rich film. The similarity between the $δ$-Bi$_2$O$_3$ and Bi$_2$Pt$_2$O$_7$ structures appears to facilitate the pyrochlore formation. These results constitute a new approach for synthesis of novel pyrochlore thin film oxygen catalysts.
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Submitted 8 October, 2014;
originally announced October 2014.
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Complex oxide growth using simultaneous in situ RHEED and x-ray reflectivity: When is one layer complete?
Authors:
M. C. Sullivan,
M. J. Ward,
Araceli Gutierrez-Llorente,
Eli R. Adler,
H. Joress,
A. Woll,
J. D. Brock
Abstract:
During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of material. However, it is well documented, but not well understood, that the phase of the RHEED oscillations is not constant and thus the maxima in the RHEED inte…
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During layer-by-layer homoepitaxial growth, both the Reflection High-Energy Electron Diffraction (RHEED) intensity and the x-ray reflection intensity will oscillate, and each complete oscillation indicates the addition of one monolayer of material. However, it is well documented, but not well understood, that the phase of the RHEED oscillations is not constant and thus the maxima in the RHEED intensity oscillations do not necessarily occur at the completion of a layer. We demonstrate this using simultaneous in situ x-ray reflectivity and RHEED during layer-by-layer growth of SrTiO$_3$. We show that we can control the RHEED oscillation phase by changing the pre-growth substrate annealing conditions, changing the RHEED oscillation phase by nearly 180$^\circ$. In addition, during growth via pulsed laser deposition, the exponential relaxation times between each laser pulse can be used to determine when a layer is complete, independent of the phase of the RHEED oscillation.
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Submitted 3 October, 2014;
originally announced October 2014.
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Thickness dependence of surface diffusion in epitaxial LaAlO3 on SrTiO3(001)
Authors:
J. D. Ferguson,
Y. Kim,
A. R. Woll,
J. D. Brock
Abstract:
The LaAlO3/SrTiO3 (001) thin film materials system was studied using in situ, simultaneous x-ray diffuse scattering and specular reflectivity during pulsed laser deposition. Using this method, we are able to measure the time dependence of the characteristic surface length scale and the characteristic time for both in-plane and downhill diffusion. These data allow for the determination of the activ…
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The LaAlO3/SrTiO3 (001) thin film materials system was studied using in situ, simultaneous x-ray diffuse scattering and specular reflectivity during pulsed laser deposition. Using this method, we are able to measure the time dependence of the characteristic surface length scale and the characteristic time for both in-plane and downhill diffusion. These data allow for the determination of the activation energy for various diffusion processes as a function of LaAlO3 thickness. Additionally, we show that the downhill diffusion rate of the first monolayer is distinctly different than subsequent layers. These results are directly compared to previous experimental observations seen during the deposition of homoepitaxial SrTiO3 (001).
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Submitted 26 October, 2010;
originally announced October 2010.
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Measurements of Surface Diffusivity and Coarsening During Pulsed Laser Deposition
Authors:
J. D. Ferguson,
G. Arikan,
D. S. Dale,
A. R. Woll,
J. D. Brock
Abstract:
Pulsed Laser Deposition (PLD) of homoepitaxial SrTiO3 <001> was studied with in-situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflectivity-based studies, these measurements access both the time- and the length-scales of the evolution of the surface morphology during growth. In particular, we show that this technique allows direct measurements of the diffusiv…
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Pulsed Laser Deposition (PLD) of homoepitaxial SrTiO3 <001> was studied with in-situ x-ray specular reflectivity and surface diffuse x-ray scattering. Unlike prior reflectivity-based studies, these measurements access both the time- and the length-scales of the evolution of the surface morphology during growth. In particular, we show that this technique allows direct measurements of the diffusivity for both inter- and intra-layer transport. Our results explicitly limit the possible role of island break-up, demonstrate the key roles played by nucleation and coarsening in PLD, and place an upper bound on the Ehrlich-Schwoebel (ES) barrier for downhill diffusion.
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Submitted 1 November, 2009; v1 submitted 19 October, 2009;
originally announced October 2009.
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X-ray scattering from surfaces: discrete and continuous components of roughness
Authors:
Darren Dale,
Aaron Fleet,
Y. Suzuki,
J. D. Brock
Abstract:
Incoherent surface scattering yields a statistical description of the surface, due to the ensemble averaging over many independently sampled volumes. Depending on the state of the surface and direction of the scattering vector relative to the surface normal, the height distribution is discrete, continuous, or a combination of the two. We present a treatment for the influence of multimodal surfac…
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Incoherent surface scattering yields a statistical description of the surface, due to the ensemble averaging over many independently sampled volumes. Depending on the state of the surface and direction of the scattering vector relative to the surface normal, the height distribution is discrete, continuous, or a combination of the two. We present a treatment for the influence of multimodal surface height distributions on Crystal Truncation Rod scattering. The effects of a multimodal height distribution are especially evident during in situ monitoring of layer-by-layer thin-film growth via Pulsed Laser Deposition. We model the total height distribution as a convolution of discrete and continuous components, resulting in a broadly applicable parameterization of surface roughness which can be applied to other scattering probes, such as electrons and neutrons. Convolution of such distributions could potentially be applied to interface or chemical scattering. Here we find that this analysis describes accurately our experimental studies of <001> SrTiO3 annealing and homoepitaxial growth.
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Submitted 10 July, 2006;
originally announced July 2006.
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Multiple Time Scales in Diffraction Measurements of Diffusive Surface Relaxation
Authors:
Aaron Fleet,
Darren Dale,
A. R. Woll,
Y. Suzuki,
J. D. Brock
Abstract:
We grew SrTiO3 on SrTiO3 (001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small angle scattering exhibits a well-defined length scale associated with the spacing between unit cell high surface features. This length scale imposes a discrete spectrum of Fourier components and rate constants upon the diffusion equation solution, evident…
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We grew SrTiO3 on SrTiO3 (001) by pulsed laser deposition, using x-ray scattering to monitor the growth in real time. The time-resolved small angle scattering exhibits a well-defined length scale associated with the spacing between unit cell high surface features. This length scale imposes a discrete spectrum of Fourier components and rate constants upon the diffusion equation solution, evident in multiple exponential relaxation of the "anti-Bragg" diffracted intensity. An Arrhenius analysis of measured rate constants confirms that they originate from a single activation energy.
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Submitted 11 April, 2005;
originally announced April 2005.
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Observed Effects of a Changing Step-Edge Density on Thin-Film Growth Dynamics
Authors:
Aaron Fleet,
Darren Dale,
Y. Suzuki,
J. D. Brock
Abstract:
We grew SrTiO3 on SrTiO3 [001] by pulsed laser deposition, while observing x-ray diffraction at the (0 0 .5) position. The drop dI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts dI/I = -4sigma(1-sigma), so that dI/I depends only on the amount of deposited material sigma. In contrast, we observed experimentally that…
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We grew SrTiO3 on SrTiO3 [001] by pulsed laser deposition, while observing x-ray diffraction at the (0 0 .5) position. The drop dI in the x-ray intensity following a laser pulse contains information about plume-surface interactions. Kinematic theory predicts dI/I = -4sigma(1-sigma), so that dI/I depends only on the amount of deposited material sigma. In contrast, we observed experimentally that |dI/I| < 4sigma(1-sigma), and that dI/I depends on the phase of x-ray growth oscillations. The combined results suggest a fast smoothing mechanism that depends on surface step-edge density.
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Submitted 31 August, 2004;
originally announced August 2004.
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Nearly strain-free heteroepitaxial system for fundamental studies of pulsed laser deposition: EuTiO3 on SrTiO3
Authors:
Huan-Hua Wang,
Aaron Fleet,
Darren Dale,
Yuri Suzuki,
J. D. Brock
Abstract:
High quality epitaxial thin-films of EuTiO3 have been grown on the (001) surface of SrTiO3 using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two-dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail using ex situ x-…
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High quality epitaxial thin-films of EuTiO3 have been grown on the (001) surface of SrTiO3 using pulsed laser deposition. In situ x-ray reflectivity measurements reveal that the growth is two-dimensional and enable real-time monitoring of the film thickness and roughness during growth. The film thickness, surface mosaic, surface roughness, and strain were characterized in detail using ex situ x-ray diffraction. The thicnkess and composition were confirmed with Rutherford Backscattering. The EuTiO3 films grow two-dimensionally, epitaxially, pseudomorphically, with no measurable in-plane lattice mismatch.
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Submitted 18 May, 2004;
originally announced May 2004.
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Temporally ordered collective creep and dynamic transition in the charge-density-wave conductor NbSe3
Authors:
S. G. Lemay,
R. E. Thorne,
Y. Li,
J. D. Brock
Abstract:
We have observed an unusual form of creep at low temperatures in the charge-density-wave (CDW) conductor NbSe$_3$. This creep develops when CDW motion becomes limited by thermally-activated phase advance past individual impurities, demonstrating the importance of local pinning and related short-length-scale dynamics. Unlike in vortex lattices, elastic collective dynamics on longer length scales…
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We have observed an unusual form of creep at low temperatures in the charge-density-wave (CDW) conductor NbSe$_3$. This creep develops when CDW motion becomes limited by thermally-activated phase advance past individual impurities, demonstrating the importance of local pinning and related short-length-scale dynamics. Unlike in vortex lattices, elastic collective dynamics on longer length scales results in temporally ordered motion and a finite threshold field. A first-order dynamic phase transition from creep to high-velocity sliding produces "switching" in the velocity-field characteristic.
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Submitted 12 August, 1999; v1 submitted 7 July, 1999;
originally announced July 1999.
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Detailed Structure of a CDW in a Quenched Random Field
Authors:
J. D. Brock,
A. C. Finnefrock,
K. L. Ringland,
E. Sweetland
Abstract:
Using high resolution x-ray scattering, we have measured the structure of the Q_1 CDW in Ta-doped NbSe_3. Detailed line shape analysis of the data demonstrates that two length scales are required to describe the phase-phase correlation function. Phase fluctuations with wavelengths less than a new length scale $a$ are suppressed and this $a$ is identified with the amplitude coherence length. We f…
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Using high resolution x-ray scattering, we have measured the structure of the Q_1 CDW in Ta-doped NbSe_3. Detailed line shape analysis of the data demonstrates that two length scales are required to describe the phase-phase correlation function. Phase fluctuations with wavelengths less than a new length scale $a$ are suppressed and this $a$ is identified with the amplitude coherence length. We find that xi_a* = 34.4 \pm 10.3 angstroms. Implications for the physical mechanisms responsible for pinning are discussed.
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Submitted 28 November, 1994;
originally announced November 1994.
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X-Ray Scattering Measurements of the Transient Structure of a Driven Charge-Density-Wave
Authors:
E. Sweetland,
A. C. Finnefrock,
W. J. Podulka,
M. Sutton,
J. D. Brock
Abstract:
We report time-resolved x-ray scattering measurements of the transient structural response of the sliding {\bf Q}$_{1}$ charge-density-wave (CDW) in NbSe$_{3}$ to a reversal of the driving electric field. The observed time scale characterizing this response at 70K varies from $\sim$ 15 msec for driving fields near threshold to $\sim$ 2 msec for fields well above threshold. The position and time-…
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We report time-resolved x-ray scattering measurements of the transient structural response of the sliding {\bf Q}$_{1}$ charge-density-wave (CDW) in NbSe$_{3}$ to a reversal of the driving electric field. The observed time scale characterizing this response at 70K varies from $\sim$ 15 msec for driving fields near threshold to $\sim$ 2 msec for fields well above threshold. The position and time-dependent strain of the CDW is analyzed in terms of a phenomenological equation of motion for the phase of the CDW order parameter. The value of the dam** constant, $γ= (3.2 \pm 0.7) \times 10^{-19}$ eV $\cdot$ seconds $\cdot$ Å$^{-3}$, is in excellent agreement with the value determined from transport measurements. As the driving field approaches threshold from above, the line shape becomes bimodal, suggesting that the CDW does not depin throughout the entire sample at one well-defined voltage.
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Submitted 22 July, 1994;
originally announced July 1994.
