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Kinetics and the crystallographic structure of bismuth during liquefaction and solidification on the insulating substrate
Authors:
Tjeerd R. J. Bollmann,
Maciej Jankowski
Abstract:
Here we study the kinetics of liquefaction and solidification of thin bismuth films grown on the insulating substrate by the pulsed laser deposited (PLD) and molecular beam epitaxy (MBE) and investigated by in situ electron and X-ray diffraction. By PLD, we can grow films similar to those obtained using MBE, studied by ex-situ AFM, KPFM, XRR, and XRD. The liquefaction-solidification transition is…
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Here we study the kinetics of liquefaction and solidification of thin bismuth films grown on the insulating substrate by the pulsed laser deposited (PLD) and molecular beam epitaxy (MBE) and investigated by in situ electron and X-ray diffraction. By PLD, we can grow films similar to those obtained using MBE, studied by ex-situ AFM, KPFM, XRR, and XRD. The liquefaction-solidification transition is monitored in real-time by RHEED and synchrotron XRD, resulting in a dewetting phenomenon and the formation of spherical droplets which size depends on the initial film thickness. Studying this phase transition in more detail, we find instantaneous liquefaction and solidification, resulting in formation of the nanodots oriented with a (110) crystallographic plane parallel to the substrate. Furthermore, we propose a two-step growth mechanism by analyzing the recorded specular diffraction rods. Overall, we show that the PLD and MBE can be used as a method for the highly controlled growth of Bi nanostructures, including their crystallographic orientation on the substrate.
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Submitted 28 April, 2022;
originally announced April 2022.
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Studying Pulsed Laser Deposition conditions for Ni/C-based multi-layers
Authors:
Tjeerd R. J. Bollmann
Abstract:
Nickel carbon based multi-layers are a viable route towards future hard X-ray and soft $γ$-ray focusing telescopes. Here, we study the Pulsed Laser Deposition growth conditions of such bilayers by Reflective High Energy Electron Diffraction, X-ray Reflectivity and Diffraction, Atomic Force Microscopy, X-ray Photoelectron Spectroscopy and cross-sectional Transmission Electron Microscopy analysis, w…
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Nickel carbon based multi-layers are a viable route towards future hard X-ray and soft $γ$-ray focusing telescopes. Here, we study the Pulsed Laser Deposition growth conditions of such bilayers by Reflective High Energy Electron Diffraction, X-ray Reflectivity and Diffraction, Atomic Force Microscopy, X-ray Photoelectron Spectroscopy and cross-sectional Transmission Electron Microscopy analysis, with emphasis on optimization of process pressure and substrate temperature during growth. The thin multi-layers are grown on a treated SiO substrate resulting in Ni and C layers with surface roughnesses (RMS) of $\leq$0.2 nm. Small droplets resulting during melting of the targets surface increase the roughness, however, and can not be avoided. The sequential process at temperatures beyond 300$^\circ$C results into intermixing between the two layers, being destructive for the reflectivity of the multi-layer.
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Submitted 3 January, 2018; v1 submitted 20 December, 2017;
originally announced December 2017.
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Imaging Pulsed Laser Deposition oxide growth by in-situ Atomic Force Microscopy
Authors:
W. A. Wessels,
T. R. J. Bollmann,
D. Post,
G. Koster,
G. Rijnders
Abstract:
To visualize the topography of thin oxide films during growth, thereby enabling to study its growth behavior quasi real-time, we have designed and integrated an atomic force microscope (AFM) in a pulsed laser deposition (PLD) vacuum setup. The AFM scanner and PLD target are integrated in a single support frame, combined with a fast sample transfer method, such that in-situ microscopy can be utiliz…
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To visualize the topography of thin oxide films during growth, thereby enabling to study its growth behavior quasi real-time, we have designed and integrated an atomic force microscope (AFM) in a pulsed laser deposition (PLD) vacuum setup. The AFM scanner and PLD target are integrated in a single support frame, combined with a fast sample transfer method, such that in-situ microscopy can be utilized after subsequent deposition pulses. The in-situ microscope can be operated from room temperature (RT) up to 700$^\circ$C and at (process) pressures ranging from the vacuum base pressure of 10$^{-6}$ mbar up to 1 mbar, typical PLD conditions for the growth of oxide films. The performance of this instrument is demonstrated by resolving unit cell height surface steps and surface topography under typical oxide PLD growth conditions.
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Submitted 8 December, 2017;
originally announced December 2017.
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Determining the energetics of vicinal perovskite oxide surfaces
Authors:
Werner A. Wessels,
Tjeerd R. J. Bollmann,
Gertjan Koster,
Harold J. W. Zandvliet,
Guus Rijnders
Abstract:
The energetics of vicinal SrTiO$_3$(001) and DyScO$_3$(110), prototypical perovskite vicinal surfaces, has been studied using topographic atomic force microscopy imaging. The kink formation and strain relaxation energies are extracted from a statistical analysis of the step meandering. Both perovskite surfaces have very similar kink formation energies and exhibit a similar triangular step undulati…
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The energetics of vicinal SrTiO$_3$(001) and DyScO$_3$(110), prototypical perovskite vicinal surfaces, has been studied using topographic atomic force microscopy imaging. The kink formation and strain relaxation energies are extracted from a statistical analysis of the step meandering. Both perovskite surfaces have very similar kink formation energies and exhibit a similar triangular step undulation. Our experiments suggest that the energetics of perovskite oxide surfaces is mainly governed by the local oxygen coordination.
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Submitted 5 December, 2016;
originally announced December 2016.
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Controlling the growth of Bi(110) and Bi(111) films on an insulating substrate
Authors:
Maciej Jankowski,
Daniel Kamiński,
Kurt Vergeer,
Marta Mirolo,
Francesco Carla,
Guus Rijnders,
Tjeerd R. J. Bollmann
Abstract:
Here we demonstrate the controlled growth of Bi(110) and Bi(111) films on an (insulating) $α$-Al$_2$O$_3$(0001) substrate by surface X-ray diffraction and X-ray reflectivity using synchrotron radiation. At temperatures as low as 40 K, unanticipated pseudo-cubic Bi(110) films are grown having a thickness ranging from a few to tens of nanometers. The roughness at the film-vacuum as well as at the fi…
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Here we demonstrate the controlled growth of Bi(110) and Bi(111) films on an (insulating) $α$-Al$_2$O$_3$(0001) substrate by surface X-ray diffraction and X-ray reflectivity using synchrotron radiation. At temperatures as low as 40 K, unanticipated pseudo-cubic Bi(110) films are grown having a thickness ranging from a few to tens of nanometers. The roughness at the film-vacuum as well as at the film-substrate interface, can be reduced by mild heating, where a crystallographic orientation transition of Bi(110) towards Bi(111) is observed at 400 K. From 450 K onwards high quality and ultrasmooth Bi(111) films are formed. Growth around the transition temperature results in the growth of competing Bi(110) and Bi(111) thin film domains.
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Submitted 14 November, 2016;
originally announced November 2016.
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The quest for companions to post-common envelope binaries. II. NSVS14256825 and HS0705+6700
Authors:
K. Beuermann,
P. Breitenstein,
B. Debski,
J. Diese,
P. A. Dubovsky,
S. Dreizler,
F. V. Hessman,
K. Hornoch,
T. -O. Husser,
G. Pojmanski,
M. Wolf,
P. R. Wozniak,
P. Zasche,
B. Denk,
M. Langer,
C. Wagner,
D. Wahrenberg,
T. Bollmann,
F. N. Habermann,
N. Haustovich,
M. Lauser,
F. Liebing,
F. Niederstadt
Abstract:
We report new mid-eclipse times of the two close binaries NSVS14256825 and HS0705+6700, harboring an sdB primary and a low-mass main-sequence secondary. Both objects display clear variations in the measured orbital period, which can be explained by the action of a third object orbiting the binary. If this interpretation is correct, the third object in NSVS14256825 is a giant planet with a mass of…
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We report new mid-eclipse times of the two close binaries NSVS14256825 and HS0705+6700, harboring an sdB primary and a low-mass main-sequence secondary. Both objects display clear variations in the measured orbital period, which can be explained by the action of a third object orbiting the binary. If this interpretation is correct, the third object in NSVS14256825 is a giant planet with a mass of roughly 12 M_Jup. For HS0705+6700, we provide evidence that strengthens the case for the suggested periodic nature of the eclipse time variation and reduces the uncertainties in the parameters of the brown dwarf implied by that model. The derived period is 8.4 yr and the mass is 31 M_Jup, if the orbit is coplanar with the binary. This research is part of the PlanetFinders project, an ongoing collaboration between professional astronomers and student groups at high schools.
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Submitted 27 February, 2012;
originally announced February 2012.
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The quest for companions to post-common envelope binaries: I. Searching a sample of stars from the CSS and SDSS
Authors:
U. Backhaus,
S. Bauer,
K. Beuermann,
J. Diese,
S. Dreizler,
F. V. Hessman,
T. -O. Husser,
K. -H. Klapdohr,
J. Moellmanns,
R. Schuenecke,
J. Dette,
J. Dubbert,
T. Miosga,
A. L. Rochus Vogel,
S. Simons,
S. Biriuk,
M. Debrah,
M. Griemens,
A. Hahn,
T. Moeller,
M. Pawlowski,
M. Schweizer,
A. -L. Speck,
C. Zapros,
T. Bollmann
, et al. (17 additional authors not shown)
Abstract:
As part of an ongoing collaboration between student groups at high schools and professional astronomers, we have searched for the presence of circum-binary planets in a bona-fide unbiased sample of twelve post-common envelope binaries (PCEBs) from the Catalina Sky Survey (CSS) and the Sloan Digital Sky Survey (SDSS). Although the present ephemerides are significantly more accurate than previous on…
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As part of an ongoing collaboration between student groups at high schools and professional astronomers, we have searched for the presence of circum-binary planets in a bona-fide unbiased sample of twelve post-common envelope binaries (PCEBs) from the Catalina Sky Survey (CSS) and the Sloan Digital Sky Survey (SDSS). Although the present ephemerides are significantly more accurate than previous ones, we find no clear evidence for orbital period variations between 2005 and 2011 or during the 2011 observing season. The sparse long-term coverage still permits O-C variations with a period of years and an amplitude of tens of seconds, as found in other systems. Our observations provide the basis for future inferences about the frequency with which planet-sized or brown-dwarf companions have either formed in these evolved systems or survived the common envelope (CE) phase.
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Submitted 10 January, 2012;
originally announced January 2012.
