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Radiation Hardness Study of the ePix100 Sensor and ASIC under Direct Illumination at the European XFEL
Authors:
I. Klačková,
K. Ahmed,
G. Blaj,
M. Cascella,
V. Cerantola,
C. Chang,
A. Dragone,
S. Göde,
S. Hauf,
C. Kenney,
J. Segal,
M. Kuster,
A. Šagátová
Abstract:
The ePix detector family provides multiple variants of hybrid pixel detectors to support a wide range of applications at free electron laser facilities. We present the results of a systematic study of the influence of radiation induced damage on the performance and lifetime of an ePix100a detector module using a direct attenuated beam of the EuXFEL at 9 keV photon energy and an average power of 10…
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The ePix detector family provides multiple variants of hybrid pixel detectors to support a wide range of applications at free electron laser facilities. We present the results of a systematic study of the influence of radiation induced damage on the performance and lifetime of an ePix100a detector module using a direct attenuated beam of the EuXFEL at 9 keV photon energy and an average power of 10 $μ$W. An area of 20 x 20 pixels was irradiated with an average photon flux of approx. 7 x $10^{9}$ photons/s to a dose of approximately 760$\pm$65 kGy at the location of the Si/SiO$_2$ interfaces in the sensor. A dose dependent increase in both offset and noise of the ePix100a detector have been observed originating from an increase of the sensor leakage current. Moreover, we observed an effect directly after irradiation resulting in the saturation of individual pixels by their dark current. Changes in gain are evaluated one and half hours post irradiation and suggest damage to occur also on the ASIC level. Based on the obtained results, thresholds for beam parameters are deduced and the detector lifetime is estimated with respect to the requirements to the data quality in order to satisfy the scientific standards defined by the experiments. We conclude the detector can withstand a beam with an energy up to 1 $μ$J at a photon energy of 9 keV impacting on an area of 1 mm$^2$. The detector can be used without significant degradation of its performance for several years if the incident photon beam intensities do not exceed the detector's dynamic range by at least three orders of magnitude. Our results provide valuable input for the operation of the ePix100a detector at FEL facilities and for the design of future detector technology.
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Submitted 17 August, 2021;
originally announced August 2021.
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Robust Pixel Gain Calibration with Limited Statistics
Authors:
G. Blaj,
G. Haller,
C. J. Kenney
Abstract:
Pixel detectors typically display pixel-to-pixel gain variation of a few percent which result in reduced spectroscopic performance. We have developed a calibration method which relies on cross-correlating histograms of many pixel pairs and obtaining large sets of relative shifts. These were subsequently used to calculate absolute pixel shifts and corresponding pixel gains. We demonstrate that this…
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Pixel detectors typically display pixel-to-pixel gain variation of a few percent which result in reduced spectroscopic performance. We have developed a calibration method which relies on cross-correlating histograms of many pixel pairs and obtaining large sets of relative shifts. These were subsequently used to calculate absolute pixel shifts and corresponding pixel gains. We demonstrate that this method yields stable gain calibration maps with an order of magnitude less statistics than required by typical approaches. Finally, we demonstrate the accuracy of the method by comparing with gain maps obtained with good statistics and monochromatic radiation at a synchrotron beamline.
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Submitted 16 July, 2019;
originally announced July 2019.
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Hammerhead, an ultrahigh resolution ePix camera for wavelength-dispersive spectrometers
Authors:
G. Blaj,
D. Bhogadi,
C. -E. Chang,
D. Doering,
C. J. Kenney,
T. Kroll,
M. Kwiatkowski,
J. Segal,
D. Sokaras,
G. Haller
Abstract:
Wavelength-dispersive spectrometers (WDS) are often used in synchrotron and FEL applications where high energy resolution (in the order of eV) is important. Increasing WDS energy resolution requires increasing spatial resolution of the detectors in the dispersion direction. The common approaches with strip detectors or small pixel detectors are not ideal. We present a novel approach, with a sensor…
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Wavelength-dispersive spectrometers (WDS) are often used in synchrotron and FEL applications where high energy resolution (in the order of eV) is important. Increasing WDS energy resolution requires increasing spatial resolution of the detectors in the dispersion direction. The common approaches with strip detectors or small pixel detectors are not ideal. We present a novel approach, with a sensor using rectangular pixels with a high aspect ratio (between strips and pixels, further called "strixels"), and strixel redistribution to match the square pixel arrays of typical ASICs while avoiding the considerable effort of redesigning ASICs. This results in a sensor area of 17.4 mm x 77 mm, with a fine pitch of 25 $μ$m in the horizontal direction resulting in 3072 columns and 176 rows. The sensors use ePix100 readout ASICs, leveraging their low noise (43 e$^-$, or 180 eV rms). We present results obtained with a Hammerhead ePix100 camera, showing that the small pitch (25 $μ$m) in the dispersion direction maximizes performance for both high and low photon occupancies, resulting in optimal WDS energy resolution. The low noise level at high photon occupancy allows precise photon counting, while at low occupancy, both the energy and the subpixel position can be reconstructed for every photon, allowing an ultrahigh resolution (in the order of 1 $μ$m) in the dispersion direction and rejection of scattered beam and harmonics. Using strixel sensors with redistribution and flip-chip bonding to standard ePix readout ASICs results in ultrahigh position resolution ($\sim$1 $μ$m) and low noise in WDS applications, leveraging the advantages of hybrid pixel detectors (high production yield, good availability, relatively inexpensive) while minimizing development complexity through sharing the ASIC, hardware, software and DAQ development with existing versions of ePix cameras.
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Submitted 15 March, 2019;
originally announced March 2019.
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Ultrafast processing of pixel detector data with machine learning frameworks
Authors:
Gabriel Blaj,
Chu-En Chang,
Christopher J. Kenney
Abstract:
Modern photon science performed at high repetition rate free-electron laser (FEL) facilities and beyond relies on 2D pixel detectors operating at increasing frequencies (towards 100 kHz at LCLS-II) and producing rapidly increasing amounts of data (towards TB/s). This data must be rapidly stored for offline analysis and summarized in real time. While at LCLS all raw data has been stored, at LCLS-II…
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Modern photon science performed at high repetition rate free-electron laser (FEL) facilities and beyond relies on 2D pixel detectors operating at increasing frequencies (towards 100 kHz at LCLS-II) and producing rapidly increasing amounts of data (towards TB/s). This data must be rapidly stored for offline analysis and summarized in real time. While at LCLS all raw data has been stored, at LCLS-II this would lead to a prohibitive cost; instead, enabling real time processing of pixel detector raw data allows reducing the size and cost of online processing, offline processing and storage by orders of magnitude while preserving full photon information, by taking advantage of the compressibility of sparse data typical for LCLS-II applications. We investigated if recent developments in machine learning are useful in data processing for high speed pixel detectors and found that typical deep learning models and autoencoder architectures failed to yield useful noise reduction while preserving full photon information, presumably because of the very different statistics and feature sets between computer vision and radiation imaging. However, we redesigned in Tensorflow mathematically equivalent versions of the state-of-the-art, "classical" algorithms used at LCLS. The novel Tensorflow models resulted in elegant, compact and hardware agnostic code, gaining 1 to 2 orders of magnitude faster processing on an inexpensive consumer GPU, reducing by 3 orders of magnitude the projected cost of online analysis at LCLS-II. Computer vision a decade ago was dominated by hand-crafted filters; their structure inspired the deep learning revolution resulting in modern deep convolutional networks; similarly, our novel Tensorflow filters provide inspiration for designing future deep learning architectures for ultrafast and efficient processing and classification of pixel detector images at FEL facilities.
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Submitted 15 March, 2019;
originally announced March 2019.
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Performance of ePix10K, a high dynamic range, gain auto-ranging pixel detector for FELs
Authors:
G. Blaj,
A. Dragone,
C. J. Kenney,
F. Abu-Nimeh,
P. Caragiulo,
D. Doering,
M. Kwiatkowski,
J. Pines,
M. Weaver,
S. Boutet,
G. Carini,
C. -E. Chang,
P. Hart,
J. Hasi,
M. Hayes,
R. Herbst,
J. Koglin,
K. Nakahara,
J. Segal,
G. Haller
Abstract:
ePix10K is a hybrid pixel detector developed at SLAC for demanding free-electron laser (FEL) applications, providing an ultrahigh dynamic range (245 eV to 88 MeV) through gain auto-ranging. It has three gain modes (high, medium and low) and two auto-ranging modes (high-to-low and medium-to-low). The first ePix10K cameras are built around modules consisting of a sensor flip-chip bonded to 4 ASICs,…
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ePix10K is a hybrid pixel detector developed at SLAC for demanding free-electron laser (FEL) applications, providing an ultrahigh dynamic range (245 eV to 88 MeV) through gain auto-ranging. It has three gain modes (high, medium and low) and two auto-ranging modes (high-to-low and medium-to-low). The first ePix10K cameras are built around modules consisting of a sensor flip-chip bonded to 4 ASICs, resulting in 352x384 pixels of 100 $μ$m x 100 $μ$m each. We present results from extensive testing of three ePix10K cameras with FEL beams at LCLS, resulting in a measured noise floor of 245 eV rms, or 67 e$^-$ equivalent noise charge (ENC), and a range of 11000 photons at 8 keV. We demonstrate the linearity of the response in various gain combinations: fixed high, fixed medium, fixed low, auto-ranging high to low, and auto-ranging medium-to-low, while maintaining a low noise (well within the counting statistics), a very low cross-talk, perfect saturation response at fluxes up to 900 times the maximum range, and acquisition rates of up to 480 Hz. Finally, we present examples of high dynamic range x-ray imaging spanning more than 4 orders of magnitude dynamic range (from a single photon to 11000 photons/pixel/pulse at 8 keV). Achieving this high performance with only one auto-ranging switch leads to relatively simple calibration and reconstruction procedures. The low noise levels allow usage with long integration times at non-FEL sources. ePix10K cameras leverage the advantages of hybrid pixel detectors with high production yield and good availability, minimize development complexity through sharing the hardware, software and DAQ development with all other versions of ePix cameras, while providing an upgrade path to 5 kHz, 25 kHz and 100 kHz in three steps over the next few years, matching the LCLS-II requirements.
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Submitted 15 March, 2019;
originally announced March 2019.
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Dead-time correction for spectroscopic photon counting pixel detectors
Authors:
Gabriel Blaj
Abstract:
Modern photon counting pixel detectors enabled a revolution in applications at synchrotron light sources and beyond in the last decade. One of the limitations of current detectors is reduced counting linearity or even paralysis at high counting rates, due to dead-time which results in photon pile-up. Existing dead-time and pile-up models fail to reproduce the complexity of dead-time effects on pho…
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Modern photon counting pixel detectors enabled a revolution in applications at synchrotron light sources and beyond in the last decade. One of the limitations of current detectors is reduced counting linearity or even paralysis at high counting rates, due to dead-time which results in photon pile-up. Existing dead-time and pile-up models fail to reproduce the complexity of dead-time effects on photon counting, resulting in empirical calibrations for particular detectors at best, imprecise linearization methods, or no linearization. This problem will increase in the future as many synchrotron light sources plan significant brilliance upgrades and free-electron lasers plan moving to a quasi-continuous operation mode. We present here the first models that use the actual behavior of the analog pre-amplifiers in spectroscopic photon counting pixel detectors with constant current discharge (e.g., Medipix family of detectors) to deduce more accurate analytical models and optimal linearization methods. In particular, for detectors with at least two counters per pixel, we completely eliminate the need of calibration, or previous knowledge of the detector and beam parameters (dead-time, integration time, large sets of synchrotron filling patterns). This is summarized in several models with increasing complexity and accuracy. Finally, we present a general empirical approach applicable to any particular cases where the analytical approach is not sufficiently precise.
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Submitted 14 March, 2019;
originally announced March 2019.
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Characterization of the ePix100a and the FastCCD Semiconductor Detectors for the European XFEL
Authors:
I. Klačková,
G. Blaj,
P. Denes,
A. Dragone,
S. Göde,
S. Hauf,
F. Januschek,
J. Joseph,
M. Kuster
Abstract:
The European X-ray Free Electron Laser (EuXFEL) is a research facility providing spatially coherent X-ray flashes in the energy range from 0.25keV to 25keV of unprecedented brilliance and with unique time structure: X-ray pulses with a 4.5 MHz repetition rate arranged in trains with 2700 pulses every 100 ms. The facility operates three photon beamlines called SASE 1, SASE 2 and SASE 3. Each of the…
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The European X-ray Free Electron Laser (EuXFEL) is a research facility providing spatially coherent X-ray flashes in the energy range from 0.25keV to 25keV of unprecedented brilliance and with unique time structure: X-ray pulses with a 4.5 MHz repetition rate arranged in trains with 2700 pulses every 100 ms. The facility operates three photon beamlines called SASE 1, SASE 2 and SASE 3. Each of the beamlines is hosting two scientific experiments. The SASE 1 beamline started its user operation in September 2017, followed by successful first lasing at the SASE 2 beamline in May 2018. Early user experiments are planned to start in 2019 at this beamline, while early user experiments for the SASE 3 beamline are scheduled for the end of 2018. The quality of the experimental data will gain substantial benefits from an accurate characterization and calibration of the X-ray detectors. Supplementing high repetition rate detectors at MHz speeds, slower detectors such as the ePix100a and the FastCCD will be operated at the train repetition rate of 10 Hz. These 2D silicon pixelized detectors use fast parallel column-wise readout implemented as a CCD or as a hybrid pixel detector. In the following, characterization and analysis approaches for the FastCCD and the ePix100a detectors are discussed and the performance of the detectors is evaluated using appropriate state-of-the-art analysis techniques.
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Submitted 12 December, 2018; v1 submitted 4 December, 2018;
originally announced December 2018.
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Detector Damage at X-Ray Free-Electron Laser Sources
Authors:
G. Blaj,
G. Carini,
S. Carron,
G. Haller,
P. Hart,
J. Hasi,
S. Herrmann,
C. Kenney,
J. Segal,
C. A. Stan,
A. Tomada
Abstract:
Free-electron lasers (FELs) opened a new window on imaging the motion of atoms and molecules. At SLAC, FEL experiments are performed at LCLS using 120 Hz pulses with 10^12 to 10^13 photons in 10 fs (billions of times brighter than at the most powerful synchrotrons). Concurrently, users and staff operate under high pressure due to flexible and often rapidly changing setups and low tolerance for sys…
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Free-electron lasers (FELs) opened a new window on imaging the motion of atoms and molecules. At SLAC, FEL experiments are performed at LCLS using 120 Hz pulses with 10^12 to 10^13 photons in 10 fs (billions of times brighter than at the most powerful synchrotrons). Concurrently, users and staff operate under high pressure due to flexible and often rapidly changing setups and low tolerance for system malfunction. This extreme detection environment raises unique challenges, from obvious to surprising, and leads to treating detectors as consumables. We discuss in detail the detector damage mechanisms observed in 7 years of operation at LCLS, together with the corresponding damage mitigation strategies and their effectiveness. Main types of damage mechanisms already identified include: (1) x-ray radiation damage (from "catastrophic" to "classical"), (2) direct and indirect damage caused by optical lasers, (3) sample induced damage, (4) vacuum related damage, (5) high-pressure environment. In total, 19 damage mechanisms have been identified. We also present general strategies for reducing damage risk or minimizing the impact of detector damage on the science program. These include availability of replacement parts and skilled operators and also careful planning, incident investigation resulting in updated designs, procedures and operator training.
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Submitted 5 June, 2017;
originally announced June 2017.
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Analytical Solutions of Transient Drift-Diffusion in P-N Junction Pixel Sensors
Authors:
G. Blaj,
C. J. Kenney,
J. Segal,
G. Haller
Abstract:
Radiation detection in applications ranging from high energy physics to medical imaging rely on solid state detectors, often hybrid pixel detectors with (1) reverse biased p-n junction pixel sensors and (2) readout ASICs, attached by flip-chip-bonding. Transient signals characteristics are important in, e.g., matching ASIC and sensor design, modeling and optimizing detector parameters and describi…
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Radiation detection in applications ranging from high energy physics to medical imaging rely on solid state detectors, often hybrid pixel detectors with (1) reverse biased p-n junction pixel sensors and (2) readout ASICs, attached by flip-chip-bonding. Transient signals characteristics are important in, e.g., matching ASIC and sensor design, modeling and optimizing detector parameters and describing timing and charge sharing properties. Currently analytical forms of transient signals are available for only a few limited cases (e.g., drift or diffusion) or for the steady state (which is not relevant for high energy radiation detection). Tools are available for (relatively slow) numerical evaluation of the transient charge transport. We present here the first analytical solutions of partial differential equations describing drift-diffusion-recombination charge transport in planar p-n junction sensors in a variety of conditions: (1) undepleted, (2) fully depleted, (3) taking into account the gradual velocity saturation, and (4) overdepleted. We deduce the Green's functions which can be applied to any detection problem through simple convolution with the initial conditions. We compare the analytical solutions with Monte Carlo simulations and industry standard simulations (Synopsys Sentaurus), demonstrating good agreement. Using the analytical equations enables fast modeling of the influence of various detector parameters on tracking, imaging and timing performance, describing performance and enabling optimizations for different applications. Finally, we illustrate this model with applications in 3D+T (x,y,z,time) photon tracking and 4D+T (x,y,theta,phi,time) relativistic charged particle tracking.
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Submitted 5 June, 2017;
originally announced June 2017.
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Optimal pulse processing, pile-up decomposition and applications of silicon drift detectors at LCLS
Authors:
G. Blaj,
C. J. Kenney,
A. Dragone,
G. Carini,
S. Herrmann,
P. Hart,
A. Tomada,
J. Koglin,
G. Haller,
S. Boutet,
M. Messerschmidt,
G. Williams,
M. Chollet,
G. Dakovski,
S. Nelson,
J. Pines,
S. Song,
J. Thayer
Abstract:
Silicon drift detectors (SDDs) revolutionized spectroscopy in fields as diverse as geology and dentistry. For a subset of experiments at ultra-fast, x-ray free-electron lasers (FELs), SDDs can make substantial contributions. Often the unknown spectrum is interesting, carrying science data, or the background measurement is useful to identify unexpected signals. Many measurements involve only severa…
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Silicon drift detectors (SDDs) revolutionized spectroscopy in fields as diverse as geology and dentistry. For a subset of experiments at ultra-fast, x-ray free-electron lasers (FELs), SDDs can make substantial contributions. Often the unknown spectrum is interesting, carrying science data, or the background measurement is useful to identify unexpected signals. Many measurements involve only several discrete photon energies known a priori, allowing single event decomposition of pile-up and spectroscopic photon counting. We designed a pulse function and demonstrated that the signal amplitude and rise time are obtained for each pulse by fitting, thus removing the need for pulse sha**. By avoiding pulse sha**, rise times of tens of nanoseconds resulted in reduced pulse pile-up and allowed decomposition of remaining pulse pile-up at photon separation times down to hundreds of nanoseconds while yielding time-of-arrival information with precision of 10 nanoseconds. Waveform fitting yields simultaneously high energy resolution and high counting rates (2 orders of magnitude higher than current digital pulse processors). We showed that pile-up spectrum fitting is relatively simple and preferable to pile-up spectrum deconvolution. We developed a photon pile-up statistical model for constant intensity sources, extended it to variable intensity sources (typical for FELs) and used it to fit a complex pile-up spectrum. We subsequently developed a Bayesian pile-up decomposition method that allows decomposing pile-up of single events with up to 6 photons from 6 monochromatic lines with 99% accuracy. The usefulness of SDDs will continue into the x-ray FEL era of science. Their successors, the ePixS hybrid pixel detectors, already offer hundreds of pixels, each with similar performance to an SDD, in a compact, robust and affordable package
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Submitted 19 March, 2019; v1 submitted 5 June, 2017;
originally announced June 2017.
