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Showing 1–1 of 1 results for author: Bittner, O

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  1. arXiv:2108.06131  [pdf, other

    cs.CR

    The Forgotten Threat of Voltage Glitching: A Case Study on Nvidia Tegra X2 SoCs

    Authors: Otto Bittner, Thilo Krachenfels, Andreas Galauner, Jean-Pierre Seifert

    Abstract: Voltage fault injection (FI) is a well-known attack technique that can be used to force faulty behavior in processors during their operation. Glitching the supply voltage can cause data value corruption, skip security checks, or enable protected code paths. At the same time, modern systems on a chip (SoCs) are used in security-critical applications, such as self-driving cars and autonomous machine… ▽ More

    Submitted 16 August, 2021; v1 submitted 13 August, 2021; originally announced August 2021.

    Comments: This is the authors' version of the article accepted for publication at the 2021 Workshop on Fault Detection and Tolerance in Cryptography (FDTC)