High-rate axial-field ionization chamber for particle identification of radioactive beams
Authors:
J. Vadas,
Varinderjit Singh,
G. Visser,
A. Alexander,
S. Hudan,
J. Huston,
B. B. Wiggins,
A. Chbihi,
M. Famiano,
M. M. Bischak,
R. T. deSouza
Abstract:
The design, construction and performance characteristics of a simple axial-field ionization chamber suitable for identifying ions in a radioactive beam are presented. Optimized for use with low-energy radioactive beams (< 5 MeV/A) the detector presents only three 0.5 $μ$m/cm$^2$ foils to the beam in addition to the detector gas. A fast charge sensitive amplifier (CSA) integrated into the detector…
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The design, construction and performance characteristics of a simple axial-field ionization chamber suitable for identifying ions in a radioactive beam are presented. Optimized for use with low-energy radioactive beams (< 5 MeV/A) the detector presents only three 0.5 $μ$m/cm$^2$ foils to the beam in addition to the detector gas. A fast charge sensitive amplifier (CSA) integrated into the detector design is also described. Coupling this fast CSA to the axial field ionization chamber produces an output pulse with a risetime of 60-70 ns and a fall time of 100 ns, making the detector capable of sustaining a relatively high rate. Tests with an $α$ source establish the detector energy resolution as $\sim$8 $\%$ for an energy deposit of $\sim$3.5 MeV. The energy resolution with beams of 2.5 and 4.0 MeV/A $^{39}$K ions and the dependence of the energy resolution on beam intensity is measured. At an instantaneous rate of 3 x 10$^5$ ions/s the energy resolution has degraded to 14% with a pileup of 12%. The good energy resolution of this detector at rates up to 3 x 10$^5$ ions/s makes it an effective tool in the characterization of low-energy radioactive beams.
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Submitted 10 August, 2016;
originally announced August 2016.
Hole Concentration Effect on the Microwave Nonlinearity of Tl2Ba2CaCu2O8-d Superconducting Thin Films
Authors:
M. M. Bischak,
J. Thomas,
R. R. Philip,
S. K. Remillard
Abstract:
The carrier concentration of Tl2Ba2CaCu2O8 films was modified by annealing in N2 gas. X-ray analysis of the structure and the oxygen content revealed a correspondence between carrier concentration and oxygen depletion. The TC and nonlinear surface impedance was measured using a dielectric resonator and the nonlinearity slope parameter r=dXS/dRS was found to converge to unity at the critical temper…
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The carrier concentration of Tl2Ba2CaCu2O8 films was modified by annealing in N2 gas. X-ray analysis of the structure and the oxygen content revealed a correspondence between carrier concentration and oxygen depletion. The TC and nonlinear surface impedance was measured using a dielectric resonator and the nonlinearity slope parameter r=dXS/dRS was found to converge to unity at the critical temperature, indicating a dominance of Josephson fluxon hysteresis on the nonlinearity. Highly inductive nonlinearity was observed in a small range of do** levels between 0.180<p<0.195 holes/Cu, which does not include the optimal do** level of 0.16 holes/Cu.
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Submitted 15 October, 2013;
originally announced October 2013.
