Improved Performance of Organic Light-Emitting Transistors Enabled by Polyurethane Gate Dielectric
Authors:
Arthur R. J. Barreto,
Graziâni Candiotto,
Harold J. C. Avila,
Rafael S. Carvalho,
Aline Magalhães dos Santos,
Mario Prosa,
Emilia Benvenuti,
Salvatore Moschetto,
Stefano Toffanin,
Rodrigo B. Capaz,
Michele Muccini,
Marco Cremona
Abstract:
Organic light-emitting transistors (OLETs) are multifunctional optoelectronic devices that combine in a single structure the advantages of organic light emitting diodes (OLEDs) and organic field-effect transistors (OFETs). However, low charge mobility and high threshold voltage are critical hurdles to practical OLETs implementation. This work reports on the improvements obtained by using polyureth…
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Organic light-emitting transistors (OLETs) are multifunctional optoelectronic devices that combine in a single structure the advantages of organic light emitting diodes (OLEDs) and organic field-effect transistors (OFETs). However, low charge mobility and high threshold voltage are critical hurdles to practical OLETs implementation. This work reports on the improvements obtained by using polyurethane films as dielectric layer material in place of the standard poly(methylmethacrylate) (PMMA) in OLET devices. It was found that polyurethane drastically reduces the number of traps in the device thereby improving electrical and optoelectronic device parameters. In addition, a model was developed to rationalize an anomalous behavior at the pinch-off voltage. Our findings represent a step forward to overcome the limiting factors of OLETs that prevent their use in commercial electronics by providing a simple route for low-bias device operation.
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Submitted 4 December, 2023;
originally announced December 2023.
Extended virtual element method for two-dimensional linear elastic fracture
Authors:
Elena Benvenuti,
Andrea Chiozzi,
Gianmarco Manzini,
N. Sukumar
Abstract:
In this paper, we propose an eXtended Virtual Element Method (X-VEM) for two-dimensional linear elastic fracture. This approach, which is an extension of the standard Virtual Element Method (VEM), facilitates mesh-independent modeling of crack discontinuities and elastic crack-tip singularities on general polygonal meshes. For elastic fracture in the X-VEM, the standard virtual element space is au…
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In this paper, we propose an eXtended Virtual Element Method (X-VEM) for two-dimensional linear elastic fracture. This approach, which is an extension of the standard Virtual Element Method (VEM), facilitates mesh-independent modeling of crack discontinuities and elastic crack-tip singularities on general polygonal meshes. For elastic fracture in the X-VEM, the standard virtual element space is augmented by additional basis functions that are constructed by multiplying standard virtual basis functions by suitable enrichment fields, such as asymptotic mixed-mode crack-tip solutions. The design of the X-VEM requires an extended projector that maps functions lying in the extended virtual element space onto a set spanned by linear polynomials and the enrichment fields. An efficient scheme to compute the mixed-mode stress intensity factors using the domain form of the interaction integral is described. The formulation permits integration of weakly singular functions to be performed over the boundary edges of the element. Numerical experiments are conducted on benchmark mixed-mode linear elastic fracture problems that demonstrate the sound accuracy and optimal convergence in energy of the proposed formulation.
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Submitted 7 November, 2021;
originally announced November 2021.
