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Computational ghost imaging for transmission electron microscopy
Authors:
Akhil Kallepalli,
Lorenzo Viani,
Daan Stellinga,
Enzo Rotunno,
Ming-Jie Sun,
Richard Bowman,
Paolo Rosi,
Stefano Frabboni,
Roberto Balboni,
Andrea Migliori,
Vincenzo Grillo,
Miles Padgett
Abstract:
While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost imaging techniques in electron microscopy to reduce the total required intensity. The technological lack of the equivalent high-resolution, optical spatial light m…
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While transmission electron microscopes (TEM) can achieve a much higher resolution than optical microscopes, they face challenges of damage to samples during the high energy processes involved. Here, we explore using computational ghost imaging techniques in electron microscopy to reduce the total required intensity. The technological lack of the equivalent high-resolution, optical spatial light modulator for electrons means that a different approach needs to be pursued. To this end, we show a beam sha** technique based on the use of a distribution of electrically charged metal needles to structure the beam, alongside a novel reconstruction method to handle the resulting highly non-orthogonal patterns. Second, we illustrate the application of this ghost imaging approach in electron microscopy. To test the full extent of the capabilities of this technique, we realised an analogous optical setup method. In both regimes, the ability to reduce the amount of total illumination intensity is evident in comparison to raster scanning.
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Submitted 21 April, 2022;
originally announced April 2022.
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Theoretical and practical aspects of the design and production of synthetic holograms for transmission electron microscopy
Authors:
Paolo Rosi,
Federico Venturi,
Giacomo Medici,
Claudia Menozzi,
Gian Carlo Gazzadi,
Enzo Rotunno,
Stefano Frabboni,
Roberto Balboni,
Mohammadreza Rezaee,
Amir H. Tavabi,
Rafal E. Dunin-Borkowski,
Ebrahim Karimi,
Vincenzo Grillo
Abstract:
Beam sha** - the ability to engineer the phase and the amplitude of massive and massless particles - has long interested scientists working on communication, imaging and the foundations of quantum mechanics. In light optics, the sha** of electromagnetic waves (photons) can be achieved using techniques that include, but are not limited to, direct manipulation of the beam source (as in X-ray Fre…
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Beam sha** - the ability to engineer the phase and the amplitude of massive and massless particles - has long interested scientists working on communication, imaging and the foundations of quantum mechanics. In light optics, the sha** of electromagnetic waves (photons) can be achieved using techniques that include, but are not limited to, direct manipulation of the beam source (as in X-ray Free Electron Lasers (XFELs) and Synchrotrons), deformable mirrors, spatial light modulators, mode converters and holograms. The recent introduction of holographic masks for electrons provides new possibilities for electron beam sha**. Their fabrication has been made possible by advances in micrometric and nanometric device production using lithography and focused ion beam patterning. This article provides a tutorial on the generation, production and analysis of synthetic holograms for transmission electron microscopy. It begins with an introduction to synthetic holograms, outlining why they are useful for beam sha** to study material properties. It then focuses on the fabrication of the required devices from theoretical and experimental perspectives, with examples taken from both simulations and experimental results. Applications of synthetic electron holograms as aberration correctors, electron vortex generators and spatial mode sorters are then presented.
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Submitted 9 September, 2021;
originally announced September 2021.
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Towards a holographic approach to spherical aberration correction in scanning transmission electron microscopy
Authors:
Vincenzo Grillo,
Amir H. Tavabi,
Emrah Yucelen,
Peng-Han Lu,
Federico Venturi,
Hugo Larocque,
Lei **,
Aleksei Savenko,
Gian Carlo Gazzadi,
Roberto Balboni,
Stefano Frabboni,
Peter Tiemeijer,
Rafal E. Dunin-Borkowski,
Ebrahim Karimi
Abstract:
Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning transmission electron microscope and demonstrate an improvement in spatial resolution. Such a holographic approach to spherical aberration correction is advantag…
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Recent progress in phase modulation using nanofabricated electron holograms has demonstrated how the phase of an electron beam can be controlled. In this paper, we apply this concept to the correction of spherical aberration in a scanning transmission electron microscope and demonstrate an improvement in spatial resolution. Such a holographic approach to spherical aberration correction is advantageous for its simplicity and cost-effectiveness.
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Submitted 1 June, 2017; v1 submitted 13 May, 2017;
originally announced May 2017.
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Phase retrieval of an electron vortex beam using diffraction holography
Authors:
Federico Venturi,
Marco Campanini,
Gian Carlo Gazzadi,
Roberto Balboni,
Stefano Frabboni,
Robert W. Boyd,
Rafal E. Dunin-Borkowski,
Ebrahim Karimi,
Vincenzo Grillo
Abstract:
In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a r…
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In both light optics and electron optics, the amplitude of a wave scattered by an object is an observable that is usually recorded in the form of an intensity distribution in a real space image or a diffraction image. In contrast, retrieval of the phase of a scattered wave is a well-known challenge, which is usually approached by interferometric or numerical methods. In electron microscopy, as a result of constraints in the lens setup, it is particularly difficult to retrieve the phase of a diffraction image. Here, we use a defocused beam generated by a nanofabricated hologram to form a reference wave that can be interfered with a diffracted beam. This setup provides an extended interference region with the sample wavefunction in the Fraunhofer plane. As a case study, we retrieve the phase of an electron vortex beam. Beyond this specific example, the approach can be used to retrieve the wavefronts of diffracted beams from a wide range of samples.
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Submitted 24 March, 2017;
originally announced March 2017.
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Realization of electron vortices with large orbital angular momentum using miniature holograms fabricated by electron beam lithography
Authors:
E. Mafakheri,
A. H. Tavabi,
P. -H. Lu,
R. Balboni,
F. Venturi,
C. Menozzi,
G. C. Gazzadi,
S. Frabboni,
A. Sit,
R. E. Dunin-Borkowski,
E. Karimi,
V. Grillo
Abstract:
Free electron beams that carry high values of orbital angular momentum (OAM) possess large magnetic moments along the propagation direction. This makes them an ideal probe for measuring the electronic and magnetic properties of materials, and for fundamental experiments in magnetism. However, their generation requires the use of complex diffractive elements, which usually take the form of nano-fab…
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Free electron beams that carry high values of orbital angular momentum (OAM) possess large magnetic moments along the propagation direction. This makes them an ideal probe for measuring the electronic and magnetic properties of materials, and for fundamental experiments in magnetism. However, their generation requires the use of complex diffractive elements, which usually take the form of nano-fabricated holograms. Here, we show how the limitations of focused ion beam milling in the fabrication of such holograms can be overcome by using electron beam lithography. We demonstrate experimentally the realization of an electron vortex beam with the largest OAM value that has yet been reported (L = 1000h\bar), paving the way for even more demanding demonstrations and applications of electron beam sha**.
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Submitted 2 December, 2016;
originally announced December 2016.
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Measuring an electron beam's orbital angular momentum spectrum
Authors:
incenzo Grillo,
Amir H. Tavabi,
Federico Venturi,
Hugo Larocque,
Roberto Balboni,
Gian Carlo Gazzadi,
Stefano Frabboni,
Peng-Han Lu,
Erfan Mafakheri,
Frédéric Bouchard,
Rafal E. Dunin-Borkowski,
Robert W. Boyd,
Martin P. J. Lavery,
Miles J. Padgett,
Ebrahim Karimi
Abstract:
Quantum complementarity states that particles, e.g. electrons, can exhibit wave-like properties such as diffraction and interference upon propagation. \textit{Electron waves} defined by a helical wavefront are referred to as twisted electrons~\cite{uchida:10,verbeeck:10,mcmorran:11}. These electrons are also characterised by a quantized and unbounded magnetic dipole moment parallel to their propag…
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Quantum complementarity states that particles, e.g. electrons, can exhibit wave-like properties such as diffraction and interference upon propagation. \textit{Electron waves} defined by a helical wavefront are referred to as twisted electrons~\cite{uchida:10,verbeeck:10,mcmorran:11}. These electrons are also characterised by a quantized and unbounded magnetic dipole moment parallel to their propagation direction, as they possess a net charge of $-|e|$~\cite{bliokh:07}. When interacting with magnetic materials, the wavefunctions of twisted electrons are inherently modified~\cite{lloyd:12b,schattschneider:14a,asenjo:14}. Such variations therefore motivate the need to analyze electron wavefunctions, especially their wavefronts, in order to obtain information regarding the material's structure~\cite{harris:15}. Here, we propose, design, and demonstrate the performance of a device for measuring an electron's azimuthal wavefunction, i.e. its orbital angular momentum (OAM) content. Our device consists of nanoscale holograms designed to introduce astigmatism onto the electron wavefunctions and spatially separate its phase components. We sort pure and superposition OAM states of electrons ranging within OAM values of $-10$ and $10$. We employ the device to analyze the OAM spectrum of electrons having been affected by a micron-scale magnetic dipole, thus establishing that, with a midfield optical configuration, our sorter can be an instrument for nano-scale magnetic spectroscopy.
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Submitted 28 September, 2016;
originally announced September 2016.
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Generation and Application of Bessel Beams in Electron Microscopy
Authors:
Vincenzo Grillo,
Jérémie Harris,
Gian Carlo Gazzadi,
Roberto Balboni,
Erfan Mafakheri,
Mark R. Dennis,
Stefano Frabboni,
Robert W. Boyd,
Ebrahim Karimi
Abstract:
We report a systematic treatment of the holographic generation of electron Bessel beams, with a view to applications in electron microscopy. We describe in detail the theory underlying hologram patterning, as well as the actual electro-optical configuration used experimentally. We show that by optimizing our nanofabrication recipe, electron Bessel beams can be generated with efficiencies reaching…
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We report a systematic treatment of the holographic generation of electron Bessel beams, with a view to applications in electron microscopy. We describe in detail the theory underlying hologram patterning, as well as the actual electro-optical configuration used experimentally. We show that by optimizing our nanofabrication recipe, electron Bessel beams can be generated with efficiencies reaching $37 \pm 3\%$. We also demonstrate by tuning various hologram parameters that electron Bessel beams can be produced with many visible rings, making them ideal for interferometric applications, or in more highly localized forms with fewer rings, more suitable for imaging. We describe the settings required to tune beam localization in this way, and explore beam and hologram configurations that allow the convergences and topological charges of electron Bessel beams to be controlled. We also characterize the phase structure of the Bessel beams generated with our technique, using a simulation procedure that accounts for imperfections in the hologram manufacturing process. Finally, we discuss a specific potential application of electron Bessel beams in scanning transmission electron microscopy.
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Submitted 28 May, 2015;
originally announced May 2015.
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Convergent beam electron-diffraction investigation of lattice mismatch and static disorder in GaAs/GaAs1-xNx intercalated GaAs/GaAs1-xNx:H heterostructures
Authors:
Stefano Frabboni,
Vincenzo Grillo,
Gian Carlo Gazzadi,
Roberto Balboni,
Rinaldo Trotta,
Antonio Polimeni,
Mario Capizzi,
Faustino Martelli,
Silvia Rubini,
Giulio Guzzinati,
Frank Glas
Abstract:
Hydrogen incorporation in diluted nitride semiconductors dramatically modifies the electronic and structural properties of the crystal through the creation of nitrogen-hydrogen complexes. We report a convergent beam electron-diffraction characterization of diluted nitride semiconductor-heterostructures patterned at a sub-micron scale and selectively exposed to hydrogen. We present a method to dete…
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Hydrogen incorporation in diluted nitride semiconductors dramatically modifies the electronic and structural properties of the crystal through the creation of nitrogen-hydrogen complexes. We report a convergent beam electron-diffraction characterization of diluted nitride semiconductor-heterostructures patterned at a sub-micron scale and selectively exposed to hydrogen. We present a method to determine separately perpendicular mismatch and static disorder in pristine and hydrogenated heterostructures. The roles of chemical composition and strain on static disorder have been separately assessed.
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Submitted 9 October, 2014;
originally announced October 2014.
