Showing 1–2 of 2 results for author: Balamurugan, A K
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Mass spectral analysis and quantification of Secondary Ion Mass Spectrometry data
Authors:
A. K. Balamurugan,
S. Dash,
A. K. Tyagi
Abstract:
This work highlights the possibility of improving the quantification aspect of Cs-complex ions in SIMS (Secondary Ion Mass Spectrometry), by combining the intensities of all possible Cs-complexes. Identification of all possible Cs-complexes requires quantitative analysis of mass spectrum from the material of interest. The important steps of this mass spectral analysis include constructing fingerpr…
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This work highlights the possibility of improving the quantification aspect of Cs-complex ions in SIMS (Secondary Ion Mass Spectrometry), by combining the intensities of all possible Cs-complexes. Identification of all possible Cs-complexes requires quantitative analysis of mass spectrum from the material of interest. The important steps of this mass spectral analysis include constructing fingerprint mass spectra of the constituent species from the table of isotopic abundances of elements, constructing the system(s) of linear equations to get the intensities of those species, solving them, evaluating the solutions and employing a regularization process when required. These steps are comprehensively described and the results of their application on a SIMS mass spectrum obtained from D9 steel are presented. It is demonstrated that results from the summation procedure, which covers entire range of sputtered clusters, is superior to results from single Cs-complex per element. The result of employing a regularization process in solving a mass spectrum from an SS316LN steel specimen is provided to demonstrate the necessity of regularization.
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Submitted 29 October, 2014; v1 submitted 26 September, 2014;
originally announced September 2014.
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Fe and N self-diffusion in amorphous FeN: A SIMS and neutron reflectivity study
Authors:
S. Chakravarty,
M. Gupta,
A. Gupta,
S. Rajagopalan,
A. K. Balamurugan,
A. K. Tyagi,
U. P. Deshpande,
M. Horisberger,
T. Gutberlet
Abstract:
Simultaneous measurement of self-diffusion of iron and nitrogen in amorphous iron nitride (Fe86N14) using secondary ion mass spectroscopy (SIMS) technique has been done. In addition neutron reflectivity (NR) technique was employed to study the Fe diffusion in the same compound. The broadening of a tracer layer of 57Fe8615N14 sandwiched between Fe86N14 layers was observed after isothermal vacuum…
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Simultaneous measurement of self-diffusion of iron and nitrogen in amorphous iron nitride (Fe86N14) using secondary ion mass spectroscopy (SIMS) technique has been done. In addition neutron reflectivity (NR) technique was employed to study the Fe diffusion in the same compound. The broadening of a tracer layer of 57Fe8615N14 sandwiched between Fe86N14 layers was observed after isothermal vacuum annealing of the films at different temperatures in SIMS measurements. And a decay of the Bragg peak intensity after isothermal annealing was observed in [Fe86N14/57Fe86N14]10 multilayers in NR. Strong structural relaxation of diffusion coefficient was observed below the crystallization temperature of the amorphous phase in both measurements. It was observed from the SIMS measurements that Fe diffusion was about 2 orders of magnitude smaller compared to nitrogen at a given temperature. The NR measurements reveal that the mechanism of Fe self-diffusion is very similar to that in metal-metal type metallic glasses. The structural relaxation time for Fe and N diffusion was found comparable indicating that the obtained relaxation time essentially pertain to the structural relaxation of the amorphous phase.
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Submitted 8 July, 2008;
originally announced July 2008.
