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Multi-mode Analysis of Surface Losses in a Superconducting Microwave Resonator in High Magnetic Fields
Authors:
T. Braine,
G. Rybka,
A. A. Baker,
J. Brodsky,
G. Carosi,
N. Du,
N. Woollett,
S. Knirck,
M. Jones
Abstract:
This paper reports on a surface impedance measurement of a niobium titanium superconducting radio frequency (SRF) cavity in a magnetic field (up to $10\,{\rm T}$). A novel method is employed to decompose the surface resistance contributions of the cylindrical cavity end caps and walls using measurements from multiple $TM$ cavity modes. The results confirm that quality factor degradation of a NbTi…
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This paper reports on a surface impedance measurement of a niobium titanium superconducting radio frequency (SRF) cavity in a magnetic field (up to $10\,{\rm T}$). A novel method is employed to decompose the surface resistance contributions of the cylindrical cavity end caps and walls using measurements from multiple $TM$ cavity modes. The results confirm that quality factor degradation of a NbTi SRF cavity in a high magnetic field is primarily from surfaces perpendicular to the field (the cavity end caps), while parallel surface resistances (the walls) remain relatively constant. This result is encouraging for applications needing high Q cavities in strong magnetic fields, such as the Axion Dark Matter eXperiment (ADMX), because it opens the possibility of hybrid SRF cavity construction to replace conventional copper cavities.
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Submitted 24 August, 2022;
originally announced August 2022.
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Magnetic Properties and Electronic Structure of Magnetic Topological Insulator MnBi$_2$Se$_4$
Authors:
Tiancong Zhu,
Alexander J. Bishop,
Tong Zhou,
Menglin Zhu,
Dante J. O'Hara,
Alexander A. Baker,
Shuyu Cheng,
Robert C. Walko,
Jacob J. Repicky,
Jay A. Gupta,
Chris M. Jozwiak,
Eli Rotenberg,
**woo Hwang,
Igor Žutić,
Roland K. Kawakami
Abstract:
The intrinsic magnetic topological insulators MnBi$_2$X$_4$ (X = Se, Te) are promising candidates in realizing various novel topological states related to symmetry breaking by magnetic order. Although much progress had been made in MnBi$_2$Te$_4$, the study of MnBi$_2$Se$_4$ has been lacking due to the difficulty of material synthesis of the desired trigonal phase. Here, we report the synthesis of…
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The intrinsic magnetic topological insulators MnBi$_2$X$_4$ (X = Se, Te) are promising candidates in realizing various novel topological states related to symmetry breaking by magnetic order. Although much progress had been made in MnBi$_2$Te$_4$, the study of MnBi$_2$Se$_4$ has been lacking due to the difficulty of material synthesis of the desired trigonal phase. Here, we report the synthesis of multilayer trigonal MnBi$_2$Se$_4$ with alternating-layer molecular beam epitaxy. Atomic-resolution scanning transmission electron microscopy (STEM) and scanning tunneling microscopy (STM) identify a well-ordered multilayer van der Waals (vdW) crystal with septuple-layer base units in agreement with the trigonal structure. Systematic thickness-dependent magnetometry studies illustrate the layered antiferromagnetic ordering as predicted by theory. Angle-resolved photoemission spectroscopy (ARPES) reveals the gapless Dirac-like surface state of MnBi$_2$Se$_4$, which demonstrates that MnBi$_2$Se$_4$ is a topological insulator above the magnetic ordering temperature. These systematic studies show that MnBi$_2$Se$_4$ is a promising candidate for exploring the rich topological phases of layered antiferromagnetic topological insulators.
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Submitted 17 March, 2020;
originally announced March 2020.
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Strain in epitaxial MnSi films on Si(111) in the thick film limit studied by polarization-dependent extended x-ray absorption fine structure
Authors:
A. I. Figueroa,
S. L. Zhang,
A. A. Baker,
R. Chalasani,
A. Kohn,
S. C. Speller,
D. Gianolio,
C. Pfleiderer,
G. van der Laan,
T. Hesjedal
Abstract:
We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500~Å) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investigated are phase-pure and of high quality with a sharp interface between MnSi and Si. The investigated MnSi films are in a thickness regime where the mag…
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We report a study of the strain state of epitaxial MnSi films on Si(111) substrates in the thick film limit (100-500~Å) as a function of film thickness using polarization-dependent extended x-ray absorption fine structure (EXAFS). All films investigated are phase-pure and of high quality with a sharp interface between MnSi and Si. The investigated MnSi films are in a thickness regime where the magnetic transition temperature $T_\mathrm{c}$ assumes a thickness-independent enhanced value of $\geq$43~K as compared with that of bulk MnSi, where $T_\mathrm{c} \approx 29~{\rm K}$. A detailed refinement of the EXAFS data reveals that the Mn positions are unchanged, whereas the Si positions vary along the out-of-plane [111]-direction, alternating in orientation from unit cell to unit cell. Thus, for thick MnSi films, the unit cell volume is essentially that of bulk MnSi --- except in the vicinity of the interface with the Si substrate (thin film limit). In view of the enhanced magnetic transition temperature we conclude that the mere presence of the interface, and its specific characteristics, strongly affects the magnetic properties of the entire MnSi film, even far from the interface. Our analysis provides invaluable information about the local strain at the MnSi/Si(111) interface. The presented methodology of polarization dependent EXAFS can also be employed to investigate the local structure of other interesting interfaces.
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Submitted 23 November, 2016;
originally announced November 2016.
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Transverse field muon-spin rotation measurement of the topological anomaly in a thin film of MnSi
Authors:
T. Lancaster,
F. Xiao,
Z. Salman,
I. O. Thomas,
S. J. Blundell,
F. L. Pratt,
S. J. Clark,
T. Prokscha,
A. Suter,
S. L. Zhang,
A. A. Baker,
T. Hesjedal
Abstract:
We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40 nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around $T\approx 40$ K an…
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We present the results of transverse-field muon-spin rotation measurements on an epitaxially grown 40 nm-thick film of MnSi on Si(111) in the region of the field-temperature phase diagram where a skyrmion phase has been observed in the bulk. We identify changes in the quasistatic magnetic field distribution sampled by the muon, along with evidence for magnetic transitions around $T\approx 40$ K and 30 K. Our results suggest that the cone phase is not the only magnetic texture realized in film samples for out-of-plane fields.
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Submitted 26 April, 2016; v1 submitted 16 November, 2015;
originally announced November 2015.
