Patterning enhanced tetragonality in BiFeO3 thin films with effective negative pressure by helium implantation
Authors:
C. Toulouse,
J. Fischer,
S. Farokhipoor,
L. Yedra,
F. Carla,
A. Jarnac,
E. Elkaim,
P. Fertey,
J. -N. Audinot,
T. Wirtz,
B. Noheda,
V. Garcia,
S. Fusil,
I. Peral Alonso,
M. Guennou,
J. Kreisel
Abstract:
Helium implantation in epitaxial thin films is a way to control the out-of-plane deformation independently from the in-plane strain controlled by epitaxy. In particular, implantation by means of a helium microscope allows for local implantation and patterning down to the nanometer resolution, which is of interest for device applications. We present here a study of bismuth ferrite (BiFeO3) films wh…
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Helium implantation in epitaxial thin films is a way to control the out-of-plane deformation independently from the in-plane strain controlled by epitaxy. In particular, implantation by means of a helium microscope allows for local implantation and patterning down to the nanometer resolution, which is of interest for device applications. We present here a study of bismuth ferrite (BiFeO3) films where strain was patterned locally by helium implantation. Our combined Raman, XRD and TEM study shows that the implantation causes an elongation of the BiFeO3 unit cell and ultimately a transition towards the so-called super-tetragonal polymorph via states with mixed phases. In addition, TEM reveals the onset of amorphization at a threshold dose that does not seem to impede the overall increase in tetragonality. The phase transition from the R-like to T-like BiFeO3 appears as first-order in character, with regions of phase coexistence and abrupt changes in lattice parameters.
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Submitted 15 February, 2021;
originally announced February 2021.
Synthetic Image Rendering Solves Annotation Problem in Deep Learning Nanoparticle Segmentation
Authors:
Leonid Mill,
David Wolff,
Nele Gerrits,
Patrick Philipp,
Lasse Kling,
Florian Vollnhals,
Andrew Ignatenko,
Christian Jaremenko,
Yixing Huang,
Olivier De Castro,
Jean-Nicolas Audinot,
Inge Nelissen,
Tom Wirtz,
Andreas Maier,
Silke Christiansen
Abstract:
Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and statistically relevant analysis of particle characteristics (such as e.g. size, shape and composition) is required that would greatly benefit from automated image analysis procedures. Whi…
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Nanoparticles occur in various environments as a consequence of man-made processes, which raises concerns about their impact on the environment and human health. To allow for proper risk assessment, a precise and statistically relevant analysis of particle characteristics (such as e.g. size, shape and composition) is required that would greatly benefit from automated image analysis procedures. While deep learning shows impressive results in object detection tasks, its applicability is limited by the amount of representative, experimentally collected and manually annotated training data. Here, we present an elegant, flexible and versatile method to bypass this costly and tedious data acquisition process. We show that using a rendering software allows to generate realistic, synthetic training data to train a state-of-the art deep neural network. Using this approach, we derive a segmentation accuracy that is comparable to man-made annotations for toxicologically relevant metal-oxide nanoparticle ensembles which we chose as examples. Our study paves the way towards the use of deep learning for automated, high-throughput particle detection in a variety of imaging techniques such as microscopies and spectroscopies, for a wide variety of studies and applications, including the detection of plastic micro- and nanoparticles.
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Submitted 20 November, 2020;
originally announced November 2020.
