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Real-time X-ray Phase-contrast Imaging Using SPINNet -- A Speckle-based Phase-contrast Imaging Neural Network
Authors:
Zhi Qiao,
Xianbo Shi,
Yudong Yao,
Michael J. Wojcik,
Luca Rebuffi,
Mathew J. Cherukara,
Lahsen Assoufid
Abstract:
X-ray phase-contrast imaging has become indispensable for visualizing samples with low absorption contrast. In this regard, speckle-based techniques have shown significant advantages in spatial resolution, phase sensitivity, and implementation flexibility compared with traditional methods. However, their computational cost has hindered their wider adoption. By exploiting the power of deep learning…
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X-ray phase-contrast imaging has become indispensable for visualizing samples with low absorption contrast. In this regard, speckle-based techniques have shown significant advantages in spatial resolution, phase sensitivity, and implementation flexibility compared with traditional methods. However, their computational cost has hindered their wider adoption. By exploiting the power of deep learning, we developed a new speckle-based phase-contrast imaging neural network (SPINNet) that boosts the phase retrieval speed by at least two orders of magnitude compared to existing methods. To achieve this performance, we combined SPINNet with a novel coded-mask-based technique, an enhanced version of the speckle-based method. Using this scheme, we demonstrate a simultaneous reconstruction of absorption and phase images on the order of 100 ms, where a traditional correlation-based analysis would take several minutes even with a cluster. In addition to significant improvement in speed, our experimental results show that the imaging resolution and phase retrieval quality of SPINNet outperform existing single-shot speckle-based methods. Furthermore, we successfully demonstrate its application in 3D X-ray phase-contrast tomography. Our result shows that SPINNet could enable many applications requiring high-resolution and fast data acquisition and processing, such as in-situ and in-operando 2D and 3D phase-contrast imaging and real-time at-wavelength metrology and wavefront sensing.
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Submitted 18 January, 2022;
originally announced January 2022.
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Small Bragg-plane slope errors revealed in synthetic diamond crystals
Authors:
Paresh Pradhan,
Michael Wojcik,
Xianrong Huang,
Elina Kasman,
Lahsen Assoufid,
Jayson Anton,
Deming Shu,
Sergey Terentyev,
Vladimir Blank,
Kwang-Je Kim,
Yuri Shvyd'ko
Abstract:
Wavefront-preserving x-ray diamond crystal optics are essential for numerous applications in x-ray science. Perfect crystals with flat Bragg planes are a prerequisite for wavefront preservation in Bragg diffraction. However, this condition is difficult to realize in practice because of inevitable crystal imperfections. Here we use x-ray rocking curve imaging to study the smallest achievable Bragg-…
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Wavefront-preserving x-ray diamond crystal optics are essential for numerous applications in x-ray science. Perfect crystals with flat Bragg planes are a prerequisite for wavefront preservation in Bragg diffraction. However, this condition is difficult to realize in practice because of inevitable crystal imperfections. Here we use x-ray rocking curve imaging to study the smallest achievable Bragg-plane slope errors in the best presently available synthetic diamond crystals and how they compare with those of perfect silicon crystals. We show that the smallest specific slope errors in the best diamond crystals (both freestanding or strain-free mounted) are about 0.15-0.2~$μ$rad/mm$^2$. These errors are only a factor of two larger than the 0.05-0.1~$μ$rad/mm$^2$ specific slope errors we measure in perfect silicon crystals. High-temperature annealing at 1450$^{\circ}$C of almost flawless diamond crystals reduces the slope errors very close to those of silicon. Further investigations are required to establish the wavefront-preservation properties of these crystals.
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Submitted 29 April, 2020;
originally announced May 2020.
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All-diamond optical assemblies for a beam-multiplexing X-ray monochromator at the Linac Coherent Light Source
Authors:
S. Stoupin,
S. A. Terentyev,
V. D. Blank,
Yu. V. Shvyd'ko,
K. Goetze,
L. Assoufid,
S. N. Polyakov,
M. S. Kuznetsov,
N. V. Kornilov,
J. Katsoudas,
R. Alonso-Mori,
M. Chollet,
Y. Feng,
J. M. Glownia,
H. Lemke,
A. Robert,
S. Song,
M. Sikorski,
D. Zhu
Abstract:
A double-crystal diamond (111) monochromator recently implemented at the Linac Coherent Light Source (LCLS) enables splitting of the primary X-ray beam into a pink (transmitted) and a monochromatic (reflected) branch. The first monochromator crystal with a thickness of 100 um provides sufficient X-ray transmittance to enable simultaneous operation of two beamlines. Here we report on the design, fa…
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A double-crystal diamond (111) monochromator recently implemented at the Linac Coherent Light Source (LCLS) enables splitting of the primary X-ray beam into a pink (transmitted) and a monochromatic (reflected) branch. The first monochromator crystal with a thickness of 100 um provides sufficient X-ray transmittance to enable simultaneous operation of two beamlines. Here we report on the design, fabrication, and X-ray characterization of the first and second (300-um-thick) crystals utilized in the monochromator and the optical assemblies holding these crystals. Each crystal plate has a region of about 5 X 2 mm2 with low defect concentration, sufficient for use in X-ray optics at the LCLS. The optical assemblies holding the crystals were designed to provide mounting on a rigid substrate and to minimize mounting-induced crystal strain. The induced strain was evaluated using double-crystal X-ray topography and was found to be small over the 5 X 2 mm2 working regions of the crystals.
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Submitted 23 January, 2014;
originally announced January 2014.
