Showing 1–7 of 7 results for author: As, D J

Femtosecond pump-probe absorption edge spectroscopy of cubic GaN

Authors: Elias Baron, Rüdiger Goldhahn, Shirly Espinoza, Martin Zahradník, Mateusz Rebarz, Jakob Andreasson, Michael Deppe, Donat J. As, Martin Feneberg

Abstract: Time-dependent femtosecond pump-probe spectroscopic ellipsometry studies on zincblende gallium-nitride (zb-GaN) are performed and analyzed between 2.9-3.7eV. An ultra-fast change of the absorption onset (3.23eV for zb-GaN) is observed by investigating the imaginary part of the dielectric function. The 266nm (4.66eV) pump pulses induce a large free-carrier concentration up to $4\times 10^{20}$cm… ▽ More Time-dependent femtosecond pump-probe spectroscopic ellipsometry studies on zincblende gallium-nitride (zb-GaN) are performed and analyzed between 2.9-3.7eV. An ultra-fast change of the absorption onset (3.23eV for zb-GaN) is observed by investigating the imaginary part of the dielectric function. The 266nm (4.66eV) pump pulses induce a large free-carrier concentration up to $4\times 10^{20}$cm$^{-3}$, influencing the transition energy between conduction and valence bands due to many-body effects, like band filling and band gap renormalization, up to $\approx$500meV. Additionally, the absorption of the pump-beam creates a free-carrier profile within the 605nm zb-GaN layer. This leads to varying optical properties from sample surface to substrate, which are taken into account by grading analysis for an accurate description of the experimental data. A temporal resolution of 100fs allows in-depth investigations of occurring ultra-fast relaxation and recombination processes. We provide a quantitative description of the free-carrier concentration and absorption onset at the sample surface as a function of relaxation, recombination, and diffusion yielding a characteristic relaxation time of 0.19ps and a recombination time of 26.1ps. △ Less

Submitted 5 June, 2022; originally announced June 2022.

Extremely low energy ARPES of quantum well states in cubic-GaN/AlN and GaAs/GaAlAs heterostructures

Authors: Mahdi Hajlaoui, Stefano Ponzoni, Michael Deppe, Tobias Henksmeier, Donat Josef As, Dirk Reuter, Thomas Zentgraf, Claus Michael Schneider, Mirko Cinchetti

Abstract: Quantum well (QW) heterostructures have been extensively used for the realization of a wide range of optical and electronic devices. Exploiting their potential for further improvement and development requires a fundamental understanding of their electronic structure. So far, the most commonly used experimental techniques for this purpose have been all-optical spectroscopy methods that, however, ar… ▽ More Quantum well (QW) heterostructures have been extensively used for the realization of a wide range of optical and electronic devices. Exploiting their potential for further improvement and development requires a fundamental understanding of their electronic structure. So far, the most commonly used experimental techniques for this purpose have been all-optical spectroscopy methods that, however, are generally averaged in momentum space. Additional information can be gained by angle-resolved photoelectron spectroscopy (ARPES), which measures the electronic structure with momentum resolution. Here we report on the use of extremely low energy ARPES (photon energy $\sim$ 7 eV) to increase its depth sensitivity and access buried QW states, located at 3 nm and 6 nm below the surface of cubic-GaN/AlN and GaAs/AlGaAs heterostructures, respectively. We find that the QW states in cubic-GaN/AlN can indeed be observed, but not their energy dispersion because of the high surface roughness. The GaAs/AlGaAs QW states, on the other hand, are buried too deep to be detected by extremely low energy ARPES. Since the sample surface is much flatter, the ARPES spectra of the GaAs/AlGaAs show distinct features in momentum space, which can be reconducted to the band structure of the topmost surface layer of the QW structure. Our results provide important information about the samples' properties required to perform extremely low energy ARPES experiments on electronic states buried in semiconductor heterostructures. △ Less

Submitted 11 May, 2021; originally announced May 2021.

Lasing of donor-bound excitons in ZnSe microdisks

Authors: A. Pawlis, M. Panfilova, D. J. As, K. Lischka, K. Sanaka, T. D. Ladd, Y. Yamamoto

Abstract: Excitons bound to flourine atoms in ZnSe have the potential for several quantum optical applications. Examples include optically accessible quantum memories for quantum information processing and lasing without inversion. These applications require the bound-exciton transitions to be coupled to cavities with high cooperativity factors, which results in the experimental observation of low-thresho… ▽ More Excitons bound to flourine atoms in ZnSe have the potential for several quantum optical applications. Examples include optically accessible quantum memories for quantum information processing and lasing without inversion. These applications require the bound-exciton transitions to be coupled to cavities with high cooperativity factors, which results in the experimental observation of low-threshold lasing. We report such lasing from fluorine-doped ZnSe quantum wells in 3 and 6 micron microdisk cavities. Photoluminescence and selective photoluminescence spectroscopy confirm that the lasing is due to bound-exciton transitions. △ Less

Submitted 6 March, 2008; v1 submitted 6 December, 2007; originally announced December 2007.

Comments: 4 pages, 3 figures; introduction rewritten

MBE growth of cubic AlxIn1-xN and AlxGayIn1-x-yN lattice matched to GaN

Authors: D. J. As, M. Schnietz, J. Schoermann, S. Potthast, J. W. Gerlach, J. Vogt, K. Lischka

Abstract: Ternary and quaternary cubic c-AlxIn1-xN/GaN and c-AlxGayIn1-x-y/GaN heterostructures lattice-matched to c-GaN on freestanding 3C-SiC substrates were grown by plasma-assisted molecular beam epitaxy. The c-AlxGayIn1-x-y alloy permits the independent control of band gap and lattice parameter. The ternary and quaternary films were grown at 620 C. Different alloy compositions were obtained by varyin… ▽ More Ternary and quaternary cubic c-AlxIn1-xN/GaN and c-AlxGayIn1-x-y/GaN heterostructures lattice-matched to c-GaN on freestanding 3C-SiC substrates were grown by plasma-assisted molecular beam epitaxy. The c-AlxGayIn1-x-y alloy permits the independent control of band gap and lattice parameter. The ternary and quaternary films were grown at 620 C. Different alloy compositions were obtained by varying the Al and Ga fluxes. The alloy composition was measured by Energy Dispersive X-ray Spectroscopy (EDX) and Rutherford Backscattering Spectrometry (RBS). X-ray reciprocal space map of asymmetric (-1-13) reflex were used to measure the lattice parameters and to verify the lattice match between the alloy and the c-GaN buffer. △ Less

Submitted 15 February, 2007; originally announced February 2007.

Comments: 4 pages including 4 figures

MBE Growth of Cubic InN

Authors: J. Schoermann, D. J. As, K. Lischka

Abstract: Cubic InN films were grown on top of a c-GaN buffer layer by rf-plasma assisted MBE at different growth temperatures. X-Ray diffraction investigations show that the c-InN layers consist of a nearly phase-pure zinc blende (cubic) structure with a small fraction of the wurtzite (hexagonal) phase grown on the (111) facets of the cubic layer. The content of hexagonal inclusions is decreasing with de… ▽ More Cubic InN films were grown on top of a c-GaN buffer layer by rf-plasma assisted MBE at different growth temperatures. X-Ray diffraction investigations show that the c-InN layers consist of a nearly phase-pure zinc blende (cubic) structure with a small fraction of the wurtzite (hexagonal) phase grown on the (111) facets of the cubic layer. The content of hexagonal inclusions is decreasing with decreasing growth temperature. The full-width at half-maximum (FWHM) of c-InN (002) rocking curve is about 50 arcmin. Low temperature photoluminescence measurements reveal a band gap of about 0.61eV for cubic InN. △ Less

Submitted 6 February, 2007; originally announced February 2007.

Comments: 3 pages with 3 figures; MRS Symposium, Fall Meeting 2006

Journal ref: MRS Symp. Proc. Vol. 955E, I8.3 (2007)

Room temperature green light emissions from nonpolar cubic InGaN/GaN multi quantum wells

Authors: S. F. Li, J. Schoermann, D. J. As, K. Lischka

Abstract: Cubic InGaN/GaN multi quantum wells (MQWs) with high structural and optical quality are achieved by utilizing free-standing 3C-SiC (001) substrates and optimizing InGaN quantum well growth. Superlattice peaks up to 5th order are clearly resolved in X-ray diffraction. We observe bright green room temperature photoluminescence (PL) from c-InxGa1-xN/GaN MQWs (x=0.16). The full-width at half maximum… ▽ More Cubic InGaN/GaN multi quantum wells (MQWs) with high structural and optical quality are achieved by utilizing free-standing 3C-SiC (001) substrates and optimizing InGaN quantum well growth. Superlattice peaks up to 5th order are clearly resolved in X-ray diffraction. We observe bright green room temperature photoluminescence (PL) from c-InxGa1-xN/GaN MQWs (x=0.16). The full-width at half maximum of the PL emission is about 240 meV at 300 K. The PL intensity increases with well thickness, giving proof that polarization fields which can limit the performance of the wurtzite III-nitride based devices are absent. The diffusion length of excess carriers is about 17 nm. △ Less

Submitted 5 February, 2007; originally announced February 2007.

In situ growth regime characterization of cubic GaN using reflection high energy electron diffraction

Authors: J. Schoermann, S. Potthast, D. J. As, K. Lischka

Abstract: Cubic GaN layers were grown by plasma-assisted molecular beam epitaxy on 3C-SiC (001)substrates. In situ reflection high energy electron diffraction was used to quantitatively determine the Ga coverage of the GaN surface during growth. Using the intensity of the electron beam as a probe,optimum growth conditions of c-GaN were found when a 1 ML Ga coverage is formed at the surface. 1 micrometer t… ▽ More Cubic GaN layers were grown by plasma-assisted molecular beam epitaxy on 3C-SiC (001)substrates. In situ reflection high energy electron diffraction was used to quantitatively determine the Ga coverage of the GaN surface during growth. Using the intensity of the electron beam as a probe,optimum growth conditions of c-GaN were found when a 1 ML Ga coverage is formed at the surface. 1 micrometer thick c-GaN layers had a minimum surface roughness of 2.5 nm when a Ga coverage of 1 ML was established during growth. These samples revealed also a minimum full width at half maximum of the (002)rocking curve. △ Less

Submitted 1 February, 2007; originally announced February 2007.

Comments: 3pages with 4 figures

Journal ref: Applied Physics letters, vol. 90, 041918 (2007)