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Showing 1–5 of 5 results for author: Arnoult, A

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  1. arXiv:2406.04996  [pdf, other

    physics.atom-ph

    Bose-Einstein condensate source on a optical grating-based atom chip for quantum sensor applications

    Authors: R. Calviac, A. Rouxel, S. Charlot, D. Bourrier, A. Arnoult, A. Monmayrant, O. Gauthier-Lafaye, A. Gauguet, B. Allard

    Abstract: We report the preparation of Bose-Einstein condensates (BECs) by integrating laser cooling with a grating magneto-optical trap (GMOT) and forced evaporation in a magnetic trap on a single chip. This new approach allowed us to produce a $6 \times 10^4$ atom Bose-Einstein condensate of rubidium-87 atoms with a single laser cooling beam. Our results represent a significant advance in the robustness a… ▽ More

    Submitted 7 June, 2024; originally announced June 2024.

  2. arXiv:2405.14450  [pdf

    cond-mat.mtrl-sci

    Large-Scale Epitaxial Integration of Single-Crystalline BiSb Topological Insulator on GaAs (111)A

    Authors: Mohamed Ali Khaled, Leonardo Cancellara, Salima Fekraoui, Richard Daubriac, François Bertran, Chiara Bigi, Quentin Gravelier, Richard Monflier, Alexandre Arnoult, Corentin Durand, Sébastien Plissard

    Abstract: Topological insulators (TI) are promising materials for future spintronics applications and their epitaxial integration would allow the realization of new hybrid interfaces. As the first materials studied, Bismuth Antimony alloys (Bi1-xSbx) show great potential due to their tuneable electronic band structure and efficient charge-to-spin conversion. Here, we report the growth of Bi1-xSbx thin films… ▽ More

    Submitted 23 May, 2024; originally announced May 2024.

    Comments: ACS Applied Electronic Materials, 2024

  3. arXiv:2210.03430  [pdf, other

    cond-mat.mes-hall cond-mat.mtrl-sci cs.LG

    Monitoring MBE substrate deoxidation via RHEED image-sequence analysis by deep learning

    Authors: Abdourahman Khaireh-Walieh, Alexandre Arnoult, Sébastien Plissard, Peter R. Wiecha

    Abstract: Reflection high-energy electron diffraction (RHEED) is a powerful tool in molecular beam epitaxy (MBE), but RHEED images are often difficult to interpret, requiring experienced operators. We present an approach for automated surveillance of GaAs substrate deoxidation in MBE reactors using deep learning based RHEED image-sequence classification. Our approach consists of an non-supervised auto-encod… ▽ More

    Submitted 15 December, 2022; v1 submitted 7 October, 2022; originally announced October 2022.

    Comments: 8 pages, 5 figures

    Journal ref: Crystal Growth and Design, 23(2) 892-898 (2023)

  4. Investigation of the anisotropic electron g factor as a probe of the electronic structure of GaBi$_{x}$As$_{1-x}$/GaAs epilayers

    Authors: Christopher A. Broderick, Simone Mazzucato, Hélène Carrère, Thierry Amand, Hejer Makhloufi, Alexandre Arnoult, Chantal Fontaine, Omer Donmez, Ayşe Erol, Muhammad Usman, Eoin P. O'Reilly, Xavier Marie

    Abstract: The electron Landé g factor ($g^{*}$) is investigated both experimentally and theoretically in a series of GaBi$_{x}$As$_{1-x}$/GaAs strained epitaxial layers, for bismuth compositions up to $x = 3.8$%. We measure $g^{*}$ via time-resolved photoluminescence spectroscopy, which we use to analyze the spin quantum beats in the polarization of the photoluminescence in the presence of an externally app… ▽ More

    Submitted 30 September, 2014; originally announced September 2014.

    Journal ref: Phys. Rev. B 90, 195301 (2014)

  5. Electrical spin injection into p-doped quantum dots through a tunnel barrier

    Authors: L. Lombez, P. Renucci, P. Gallo, P. F. Braun, H. Carrere, P. H. Binh, X. Marie, T. Amand, B. Urbaszek, J. L. Gauffier, T. Camps, A. Arnoult, C. Fontaine, C. Deranlot, R. Mattana, H. Jaffres, J. M. George

    Abstract: We have demonstrated by electroluminescence the injection of spin polarized electrons through Co/Al2O3/GaAs tunnel barrier into p-doped InAs/GaAs quantum dots embedded in a PIN GaAs light emitting diode. The spin relaxation processes in the p-doped quantum dots are characterized independently by optical measurements (time and polarization resolved photoluminescence). The measured electroluminesc… ▽ More

    Submitted 8 January, 2007; v1 submitted 16 October, 2006; originally announced October 2006.

    Comments: 6 pages, 4 figures

    Journal ref: Appl. Phys. Lett., 87, 252115 (2005)