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Showing 1–3 of 3 results for author: Anapolsky, A

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  1. arXiv:2309.13463  [pdf, other

    cond-mat.mtrl-sci

    A treatment of particle-electrolyte sharp interface fracture in solid-state batteries with multi-field discontinuities

    Authors: Xiaoxuan Zhang, Tryaksh Gupta, Zhenlin Wang, Amalie Trewartha, Abraham Anapolsky, Krishna Garikipati

    Abstract: In this work, we present a computational framework for coupled electro-chemo-(nonlinear) mechanics at the particle scale for solid-state batteries. The framework accounts for interfacial fracture between the active particles and solid electrolyte due to intercalation stresses. We extend discontinuous finite element methods for a sharp interface treatment of discontinuities in concentrations, fluxe… ▽ More

    Submitted 23 September, 2023; originally announced September 2023.

  2. arXiv:2107.04218  [pdf

    cond-mat.mtrl-sci cond-mat.mes-hall

    Correlative analysis of structure and chemistry of LixFePO4 platelets using 4D-STEM and X-ray ptychography

    Authors: L. A. Hughes, Benjamin H. Savitzky, Haitao D. Deng, Norman L. **, Eder G. Lomeli, Young-Sang Yu, David A. Shapiro, Patrick Herring, Abraham Anapolsky, William C. Chueh, Colin Ophus, Andrew M. Minor

    Abstract: Lithium iron phosphate (LixFePO4), a cathode material used in rechargeable Li-ion batteries, phase separates upon de/lithiation under equilibrium. The interfacial structure and chemistry within these cathode materials affects Li-ion transport, and therefore battery performance. Correlative imaging of LixFePO4 was performed using four-dimensional scanning transmission electron microscopy (4D-STEM),… ▽ More

    Submitted 9 July, 2021; originally announced July 2021.

    Comments: 17 pages, 4 figures

  3. arXiv:2003.09523  [pdf, other

    cond-mat.mtrl-sci cond-mat.mes-hall physics.app-ph

    py4DSTEM: a software package for multimodal analysis of four-dimensional scanning transmission electron microscopy datasets

    Authors: Benjamin H Savitzky, Lauren A Hughes, Steven E Zeltmann, Hamish G Brown, Shiteng Zhao, Philipp M Pelz, Edward S Barnard, Jennifer Donohue, Luis Rangel DaCosta, Thomas C. Pekin, Ellis Kennedy, Matthew T Janish, Matthew M Schneider, Patrick Herring, Chirranjeevi Gopal, Abraham Anapolsky, Peter Ercius, Mary Scott, Jim Ciston, Andrew M Minor, Colin Ophus

    Abstract: Scanning transmission electron microscopy (STEM) allows for imaging, diffraction, and spectroscopy of materials on length scales ranging from microns to atoms. By using a high-speed, direct electron detector, it is now possible to record a full 2D image of the diffracted electron beam at each probe position, typically a 2D grid of probe positions. These 4D-STEM datasets are rich in information, in… ▽ More

    Submitted 20 March, 2020; originally announced March 2020.

    Comments: 32 pages, 18 figures