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Showing 1–3 of 3 results for author: Al-Kassab, T

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  1. arXiv:1509.08785  [pdf

    physics.ins-det cond-mat.mtrl-sci

    Laser-induced reversion of $δ^{'}$ precipitates in an Al-Li alloy: Study on temperature rise in pulsed laser atom probe

    Authors: Muna Khushaim, Ryota Gemma, Talaat Al-Kassab

    Abstract: The influence of tuning the laser energy during the analyses on the resulting microstructure in a specimen utilizing an ultra-fast laser assisted atom probe was demonstrated by a case study of a binary Al-Li alloy. The decomposition parameters, such as the size, number density, volume fraction and composition of $δ^{'}$ precipitates, were carefully monitored after each analysis. A simple model was… ▽ More

    Submitted 29 September, 2015; originally announced September 2015.

    Comments: 30 pages, 10 figures and 2 tables

  2. arXiv:1412.3727  [pdf

    cond-mat.mtrl-sci

    Characterization of precipitation in Al-Li alloy AA2195 by means of atom probe tomography and transmission electron microscopy

    Authors: Muna Khushaim, Torben Boll, Judith Seibert, Fredinand Haider, Talaat Al-Kassab

    Abstract: The microstructure of the commercial alloy AA2195 was investigated on the nano-scale after conducting a T8 tempering. This particular thermo-mechanical treatment of the specimen resulted in the formation of platelet-shaped $T_{1}$ ($Al_{2}CuLi$)/ $θ^{'}$($Al_{2}Cu$) within the Al-matrix. The electrochemically prepared samples were analyzed by scanning transmission electron microscopy and atom prob… ▽ More

    Submitted 11 December, 2014; originally announced December 2014.

  3. arXiv:cond-mat/0601543  [pdf

    cond-mat.mtrl-sci

    Focused ion beam preparation of atom probe specimens containing a single crystallographically well-defined grain boundary

    Authors: F. Pérez-Willard, D. Wolde-Giorgis, T. Al-Kassab, G. A. López, E. J. Mittemeijer, R. Kirchheim, D. Gerthsen

    Abstract: Needle-shaped atom probe specimens containing a single grain boundary were produced using the focused ion beam (FIB) of a dual-beam FIB/SEM (scanning electron microscope) system. The presented specimen preparation approach allows the unprecedented study of a grain boundary which is well characterised in its crystallographic orientation by means of the field ion microscope (FIM) and the tomograph… ▽ More

    Submitted 24 January, 2006; originally announced January 2006.

    Comments: 21 pages, 6 figures